Inventor · disambiguated record
Hiroshi Hatada
Also filed as: HATADA HIROSHI
3 granted patents·88 citations·filing 1990–2001
74Inventor score
Files withTOSHIBA KK3
Top patents by PatentIndex Score
3 records- 0173US6408414B1Semiconductor device provided with a boundary-scan test circuitTOSHIBA KK·Filed 1999·Granted Jun 18, 2002·42 cites·11 claims
- 0268US6429454B2Semiconductor device with test circuitTOSHIBA KK·Filed 2001·Granted Aug 6, 2002·16 cites·18 claims
- 0365US5111271ASemiconductor device using standard cell systemTOSHIBA KK·Filed 1990·Granted May 5, 1992·30 cites·8 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →