Inventor

KANJ ROUWAIDA N

US35 patents

⚠️ This page may combine multiple inventors who share the name “KANJ ROUWAIDA N”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KANJ ROUWAIDA N

IBM

Method and computer program for efficient cell failure rate estimation in cell arrays

Energy efficient storage device using per-element selectable power supply voltages

Statistical design with importance sampling reuse

Broken-spheres methodology for improved failure probability analysis in multi-fail regions

Equivalent device statistical modeling for bitline leakage modeling

Method and computer program for controlling a storage device having per-element selectable power supply voltages

Method and computer program for selecting circuit repairs using redundant elements with consideration of aging effects

Method and system for determining element voltage selection control values for a storage device

Document retrieval using internal dictionary-hierarchies to adjust per-subject match results

Selective importance sampling

Document tagging and retrieval using per-subject dictionaries including subject-determining-power scores for entries

Statistical design with importance sampling reuse

Document tagging and retrieval using entity specifiers

Closed-loop modeling of gate leakage for fast simulators

Statistical design with importance sampling reuse

Selective importance sampling

Circuit for memory cell recovery

Document tagging and retrieval using per-subject dictionaries including subject-determining-power scores for entries

Document tagging and retrieval using entity specifiers

Document retrieval using internal dictionary-hierarchies to adjust per-subject match results

Method and system for analyzing an integrated circuit based on sample windows selected using an open deterministic sequencing technique

JOSHI RAJIV V

Methodology for correlated memory fail estimations

Technology computer-aided design (TCAD)-based virtual fabrication

On-chip leakage current modeling and measurement circuit

Table lookup method for physics based models for SPICE-like simulators

Methodology for correlated memory fail estimations

Technology computer-aided design (TCAD)-based virtual fabrication

Computer program product for controlling a storage device having per-element selectable power supply voltages

Equivalent device statistical modeling for bitline leakage modeling

Fet-bounding for fast TCAD-based variation modeling

FET-bounding for fast TCAD-based variation modeling

Table-lookup-based models for yield analysis acceleration

Circuit for memory cell recovery

Robust local bit select circuitry to overcome timing mismatch

DAWSON JAMES W

Systems and methods for memory device precharging