Inventor
HUYNH VAN C
US5 patents
Patents
5 patentsUS6418070B1Jul 9, 2002
Memory device tester and method for testing reduced power states
MICRON TECHNOLOGY INC36 citations94
US6775192B2Aug 10, 2004
Memory device tester and method for testing reduced power states
MICRON TECHNOLOGY INC10 citations71
US6674677B2Jan 6, 2004
Memory device tester and method for testing reduced power states
MICRON TECHNOLOGY INC10 citations71
US7161866B2Jan 9, 2007
Memory device tester and method for testing reduced power states
MICRON TECHNOLOGY INC2 citations60
US6914843B2Jul 5, 2005
Memory device tester and method for testing reduced power states
MICRON TECHNOLOGY INC2 citations60