Inventor
HYSLOP ADIN E
US11 patents
⚠️ This page may combine multiple inventors who share the name “HYSLOP ADIN E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
6 patentsUS5343433AAug 30, 1994
CMOS sense amplifier
TEXAS INSTRUMENTS INC36 citations92
US5127739AJul 7, 1992
CMOS sense amplifier with bit line isolation
TEXAS INSTRUMENTS INC34 citations92
US5309446AMay 3, 1994
Test validation method for a semiconductor memory device
TEXAS INSTRUMENTS INC40 citations89
US4627033ADec 2, 1986
Sense amplifier with reduced instantaneous power
TEXAS INSTRUMENTS INC25 citations82
US4608670AAug 26, 1986
CMOS sense amplifier with N-channel sensing
TEXAS INSTRUMENTS INC24 citations82
US4547868AOct 15, 1985
Dummy-cell circuitry for dynamic read/write memory
TEXAS INSTRUMENTS INC21 citations81
MICRON TECHNOLOGY INC
5 patentsUS6418070B1Jul 9, 2002
Memory device tester and method for testing reduced power states
MICRON TECHNOLOGY INC36 citations94
US6775192B2Aug 10, 2004
Memory device tester and method for testing reduced power states
MICRON TECHNOLOGY INC10 citations71
US6674677B2Jan 6, 2004
Memory device tester and method for testing reduced power states
MICRON TECHNOLOGY INC10 citations71
US7161866B2Jan 9, 2007
Memory device tester and method for testing reduced power states
MICRON TECHNOLOGY INC2 citations60
US6914843B2Jul 5, 2005
Memory device tester and method for testing reduced power states
MICRON TECHNOLOGY INC2 citations60