Inventor
BAE MYUNG HO
US22 patents
⚠️ This page may combine multiple inventors who share the name “BAE MYUNG HO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
14 patentsUS7035152B1Apr 25, 2006
System and method for redundancy memory decoding
MICRON TECHNOLOGY INC21 citations91
US10148269B1Dec 4, 2018
Dynamic termination edge control
MICRON TECHNOLOGY INC6 citations84
US11152056B1Oct 19, 2021
Integrated assemblies
MICRON TECHNOLOGY INC12 citations78
US10157648B1Dec 18, 2018
Data output for high frequency domain
MICRON TECHNOLOGY INC4 citations73
US11132142B2Sep 28, 2021
Systems and methods for writing zeros to a memory array
MICRON TECHNOLOGY INC1 citations72
US10950291B1Mar 16, 2021
Apparatuses and methods to perform duty cycle adjustment with back-bias voltage
MICRON TECHNOLOGY INC2 citations72
US10795603B2Oct 6, 2020
Systems and methods for writing zeros to a memory array
MICRON TECHNOLOGY INC1 citations72
US10497424B2Dec 3, 2019
Systems and methods for plate voltage regulation during memory array access
MICRON TECHNOLOGY INC3 citations72
US10402116B2Sep 3, 2019
Systems and methods for writing zeros to a memory array
MICRON TECHNOLOGY INC3 citations72
US11145354B2Oct 12, 2021
Apparatuses and methods to perform duty cycle adjustment with back-bias voltage
MICRON TECHNOLOGY INC0 citations62
US11087820B2Aug 10, 2021
Systems and methods for plate voltage regulation during memory array access
MICRON TECHNOLOGY INC0 citations62
US10606512B2Mar 31, 2020
On-die termination architecture
MICRON TECHNOLOGY INC1 citations62
US10483970B2Nov 19, 2019
Dynamic termination edge control
MICRON TECHNOLOGY INC0 citations52
US10470475B2Nov 12, 2019
Data output for high frequency domain
MICRON TECHNOLOGY INC0 citations52
SAMSUNG ELECTRONICS CO LTD
5 patentsUS5467039ANov 14, 1995
Chip initialization signal generating circuit
SAMSUNG ELECTRONICS CO LTD35 citations92
US5805605ASep 8, 1998
Semiconductor integrated device
SAMSUNG ELECTRONICS CO LTD17 citations83
US5045720ASep 3, 1991
Method for selecting a spare column and a circuit thereof
SAMSUNG ELECTRONICS CO LTD19 citations81
US5491435AFeb 13, 1996
Data sensing circuit with additional capacitors for eliminating parasitic capacitance difference between sensing control nodes of sense amplifier
SAMSUNG ELECTRONICS CO LTD19 citations77
US5535152AJul 9, 1996
Semiconductor chip having a low-noise power supply arrangement
SAMSUNG ELECTRONICS CO LTD8 citations72