Inventor
NAKAYAMA YOSHIKAZU
JP69 patents
⚠️ This page may combine multiple inventors who share the name “NAKAYAMA YOSHIKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NAKAYAMA YOSHIKAZU
14 patentsUS6669256B2Dec 30, 2003
Nanotweezers and nanomanipulator
NAKAYAMA YOSHIKAZU66 citations96
US6583085B1Jun 24, 2003
Method for manufacturing indium-tin-iron catalyst for use in production of carbon nanocoils
NAKAYAMA YOSHIKAZU20 citations93
US6558645B2May 6, 2003
Method for manufacturing carbon nanocoils
NAKAYAMA YOSHIKAZU26 citations93
US6787769B2Sep 7, 2004
Conductive probe for scanning microscope and machining method using the same
NAKAYAMA YOSHIKAZU21 citations92
US6705154B2Mar 16, 2004
Cantilever for vertical scanning microscope and probe for vertical scan microscope
NAKAYAMA YOSHIKAZU20 citations92
US6735046B2May 11, 2004
Nano-magnetic head and nano-magnetic head device using the same
NAKAYAMA YOSHIKAZU15 citations84
US6636050B2Oct 21, 2003
Four-terminal measuring device that uses nanotube terminals
NAKAYAMA YOSHIKAZU13 citations83
US8481158B2Jul 9, 2013
Carbon-based fine structure array, aggregate of carbon-based fine structures, use thereof and method for preparation thereof
NAKAYAMA YOSHIKAZU14 citations82
US8203347B2Jun 19, 2012
Device, method, and program for determining element, recording medium, and measurement device
NAKAYAMA YOSHIKAZU9 citations82
US6802549B2Oct 12, 2004
Nanotweezers and nanomanipulator
NAKAYAMA YOSHIKAZU7 citations74
US6719602B2Apr 13, 2004
Nanotube length control method
NAKAYAMA YOSHIKAZU11 citations74
US6703615B2Mar 9, 2004
Light receiving and emitting probe and light receiving and emitting probe apparatus
NAKAYAMA YOSHIKAZU8 citations74
US6777693B2Aug 17, 2004
Lithographic method using ultra-fine probe needle
NAKAYAMA YOSHIKAZU4 citations63
US6668652B2Dec 30, 2003
Nano-substance mass measurement method and apparatus
NAKAYAMA YOSHIKAZU6 citations63
TAKATA CORP
9 patentsUS5678858AOct 21, 1997
Air bag with tearable and non-tearable tethers
TAKATA CORP71 citations96
US5193847AMar 16, 1993
Air bag
TAKATA CORP74 citations96
US5439250AAug 8, 1995
Inflator for air bag device
TAKATA CORP37 citations93
US5174602ADec 29, 1992
Cover for accommodating an air bag
TAKATA CORP34 citations93
US4943027AJul 24, 1990
Mounting arrangement for a vehicle air bag
TAKATA CORP27 citations93
US5297813AMar 29, 1994
Air bag device having a connecting arrangement to facilitate assembly
TAKATA CORP24 citations92
US5277966AJan 11, 1994
Uncoated woven fabric and method of manufacturing same
TAKATA CORP26 citations92
US5060972AOct 29, 1991
Air bag system
TAKATA CORP44 citations92
US5306039AApr 26, 1994
Passenger's air bag assembly
TAKATA CORP17 citations74
DAIKEN CHEMICAL CO LTD
8 patentsUS6528785B1Mar 4, 2003
Fusion-welded nanotube surface signal probe and method of attaching nanotube to probe holder
DAIKEN CHEMICAL CO LTD111 citations99
US6777637B2Aug 17, 2004
Sharpening method of nanotubes
DAIKEN CHEMICAL CO LTD82 citations98
US6800865B2Oct 5, 2004
Coated nanotube surface signal probe and method of attaching nanotube to probe holder
DAIKEN CHEMICAL CO LTD34 citations96
US7073937B2Jul 11, 2006
Heat emitting probe and heat emitting probe apparatus
DAIKEN CHEMICAL CO LTD17 citations84
US6892432B2May 17, 2005
Nanotube cartridge and a method for manufacturing the same
DAIKEN CHEMICAL CO LTD14 citations80
US7064341B2Jun 20, 2006
Coated nanotube surface signal probe
DAIKEN CHEMICAL CO LTD7 citations74
US7014830B2Mar 21, 2006
Method for mass-producing carbon nanocoils
DAIKEN CHEMICAL CO LTD4 citations63
US6981727B2Jan 3, 2006
Diode-type nanotweezers and nanomanipulator device using the same
DAIKEN CHEMICAL CO LTD3 citations63
ADVANTEST CORP
7 patentsUS6421624B1Jul 16, 2002
Multi-port device analysis apparatus and method and calibration method thereof
ADVANTEST CORP57 citations94
US6496785B1Dec 17, 2002
Network analyzer, network analytical method and recording medium
ADVANTEST CORP20 citations92
US6320401B1Nov 20, 2001
Substrate inspection using the propagation characteristics of RF electromagnetic waves
ADVANTEST CORP17 citations82
US6347382B1Feb 12, 2002
Multi-port device analysis apparatus and method
ADVANTEST CORP14 citations77
US7616007B2Nov 10, 2009
Device, method, program, and recording medium for error factor measurement, and output correction device and reflection coefficient measurement device provided with the device for error factor measurement
ADVANTEST CORP2 citations63
US7348784B2Mar 25, 2008
Error factor acquisition device, method, program, and recording medium
ADVANTEST CORP4 citations62
US7652482B2Jan 26, 2010
Network analyzer, network analyzing method, automatic corrector, correcting method, program, and recording medium
ADVANTEST CORP4 citations61
YOSHIKAZU NAKAYAMA
3 patentsUS6805390B2Oct 19, 2004
Nanotweezers and nanomanipulator
YOSHIKAZU NAKAYAMA39 citations95
US6759653B2Jul 6, 2004
Probe for scanning microscope produced by focused ion beam machining
YOSHIKAZU NAKAYAMA32 citations92
US7138627B1Nov 21, 2006
Nanotube probe and method for manufacturing same
YOSHIKAZU NAKAYAMA10 citations73
JAPAN SCIENCE & TECH AGENCY
2 patentsKYOCERA CORP
2 patentsNITTO DENKO CORP
1 patentADVANTEST
1 patentSUEKANE OSAMU
1 patentMATSUSHITA ELECTRIC INDUSTRIAL CO LTD
1 patentROHDE & SCHWARZ
1 patentShowing the top 50 of 69 patents by PatentIndex Score.