Inventor
XIAO HONG
US101 patents
⚠️ This page may combine multiple inventors who share the name “XIAO HONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
XIAO HONG
18 patentsUS8754372B2Jun 17, 2014
Structure and method for determining a defect in integrated circuit manufacturing process
XIAO HONG81 citations98
US8421009B2Apr 16, 2013
Test structure for charged particle beam inspection and method for defect determination using the same
XIAO HONG81 citations98
US8299463B2Oct 30, 2012
Test structure for charged particle beam inspection and method for defect determination using the same
XIAO HONG62 citations98
US8089297B2Jan 3, 2012
Structure and method for determining a defect in integrated circuit manufacturing process
XIAO HONG92 citations97
US8750902B2Jun 10, 2014
User profile-based assistance communication system
XIAO HONG27 citations92
US8634816B2Jan 21, 2014
Limiting mobile device services in an automobile
XIAO HONG24 citations92
US8759762B2Jun 24, 2014
Method and apparatus for identifying plug-to-plug short from a charged particle microscopic image
XIAO HONG13 citations84
US8527575B2Sep 3, 2013
Queue processing system
XIAO HONG11 citations84
US8970699B2Mar 3, 2015
Methods and systems for automobile security monitoring
XIAO HONG17 citations83
US8600831B2Dec 3, 2013
Automated automobile maintenance using a centralized expert system
XIAO HONG8 citations83
US8849348B2Sep 30, 2014
Mobile device session switching
XIAO HONG12 citations80
US8809779B2Aug 19, 2014
Method and system for heating substrate in vacuum environment and method and system for identifying defects on substrate
XIAO HONG5 citations73
US8092641B1Jan 10, 2012
System and method for removing organic residue from a charged particle beam system
XIAO HONG6 citations73
US9538229B2Jan 3, 2017
Media experience for touch screen devices
XIAO HONG2 citations72
US8737913B2May 27, 2014
Methods and systems for providing a wireless automobile key service
XIAO HONG5 citations72
US8723115B2May 13, 2014
Method and apparatus for detecting buried defects
XIAO HONG4 citations72
US9202019B2Dec 1, 2015
Program service based on individual identification
XIAO HONG3 citations63
US8193491B2Jun 5, 2012
Structure and method for determining a defect in integrated circuit manufacturing process
XIAO HONG2 citations63
HERMES MICROVISION INC
6 patentsUS8748814B1Jun 10, 2014
Structure for inspecting defects in word line array fabricated by SADP process and method thereof
HERMES MICROVISION INC63 citations98
US9282293B2Mar 8, 2016
Method and system for measuring critical dimension and monitoring fabrication uniformity
HERMES MICROVISION INC4 citations84
US7919760B2Apr 5, 2011
Operation stage for wafer edge inspection and review
HERMES MICROVISION INC15 citations83
US9100553B2Aug 4, 2015
Method and system for measuring critical dimension and monitoring fabrication uniformity
HERMES MICROVISION INC3 citations63
US9041795B2May 26, 2015
Method and system for measuring critical dimension and monitoring fabrication uniformity
HERMES MICROVISION INC3 citations63
US8050490B2Nov 1, 2011
Method for inspecting overlay shift defect during semiconductor manufacturing and apparatus thereof
HERMES MICROVISION INC4 citations63
SHENZHEN FUTAIHONG PREC IND CO
5 patentsUSD558460SJan 1, 2008
Digital photo frame
SHENZHEN FUTAIHONG PREC IND CO488 citations99
USD569629SMay 27, 2008
Digital photo frame
SHENZHEN FUTAIHONG PREC IND CO89 citations98
USD563379SMar 4, 2008
Mobile phone
SHENZHEN FUTAIHONG PREC IND CO109 citations97
USD558788SJan 1, 2008
Multimedia player
SHENZHEN FUTAIHONG PREC IND CO33 citations93
USD559268SJan 8, 2008
Multimedia player
SHENZHEN FUTAIHONG PREC IND CO9 citations80
VERIZON PATENT & LICENSING INC
4 patentsUS9276807B2Mar 1, 2016
Redundant communication framework
VERIZON PATENT & LICENSING INC10 citations83
US9813308B2Nov 7, 2017
Statistical monitoring of customer devices
VERIZON PATENT & LICENSING INC2 citations72
US9307089B2Apr 5, 2016
Conference call systems and methods
VERIZON PATENT & LICENSING INC6 citations72
US9058734B2Jun 16, 2015
Alert sensing and monitoring via a user device
VERIZON PATENT & LICENSING INC4 citations72
KLA TENCOR CORP
4 patentsUS9257260B2Feb 9, 2016
Method and system for adaptively scanning a sample during electron beam inspection
KLA TENCOR CORP3 citations70
US10018579B1Jul 10, 2018
System and method for cathodoluminescence-based semiconductor wafer defect inspection
KLA TENCOR CORP6 citations69
US9696268B2Jul 4, 2017
Automated decision-based energy-dispersive x-ray methodology and apparatus
KLA TENCOR CORP3 citations68
US10446367B2Oct 15, 2019
Scan strategies to minimize charging effects and radiation damage of charged particle beam metrology system
KLA TENCOR CORP1 citations63
VARMOUR NETWORKS INC
3 patentsMACDONALD PAUL
1 patentESSEX SPECIALTY PROD
1 patentHERMES EPITEK CORP
1 patentNASIR AZIM
1 patentMATERIAL SCIENCE CORP
1 patentA10 NETWORKS INC
1 patentMATERIAL SCIENCES CORP
1 patentMOSHREFI AFSHIN
1 patentKLA CORP
1 patentFANG WEI
1 patentShowing the top 50 of 101 patents by PatentIndex Score.