Inventor · disambiguated record
Jim Hofmann
Also filed as: HOFMANN JIM · HOFMANN JIM J
18 granted patents·2 pending applications·494 citations·filing 1995–2011
96Inventor score
Top patents by PatentIndex Score
20 records- 0198US6290572B1Devices and methods for in-situ control of mechanical or chemical-mechanical planarization of microelectronic-device substrate assembliesMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 18, 2001·162 cites·57 claims
- 0297US6547640B2Devices and methods for in-situ control of mechanical or chemical-mechanical planarization of microelectronic-device substrate assembliesMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 15, 2003·76 cites·15 claims
- 0390US6461964B2Methods and apparatuses for monitoring and controlling mechanical or chemical-mechanical planarization of microelectronic substrate assembliesMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 8, 2002·28 cites·8 claims
- 0489US7625495B2Methods and apparatuses for monitoring and controlling mechanical or chemical-mechanical planarization of microelectronic substrate assembliesMICRON TECHNOLOGY INC·Filed 2006·Granted Dec 1, 2009·8 cites·19 claims
- 0589US6468912B2Methods and apparatuses for monitoring and controlling mechanical or chemical-mechanical planarization of microelectronic substrate assembliesMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 22, 2002·26 cites·9 claims
- 0688US6492273B1Methods and apparatuses for monitoring and controlling mechanical or chemical-mechanical planarization of microelectronic substrate assembliesMICRON TECHNOLOGY INC·Filed 1999·Granted Dec 10, 2002·51 cites·23 claims
- 0787US6472325B2Method and apparatuses for monitoring and controlling mechanical or chemical-mechanical planarization of microelectronic substrate assembliesMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 29, 2002·23 cites·11 claims
- 0886US6699791B2Methods and apparatuses for monitoring and controlling mechanical or chemical-mechanical planarization of microelectronic substrate assembliesMICRON TECHNOLOGY INC·Filed 2002·Granted Mar 2, 2004·19 cites·43 claims
- 0982US7329168B2Extended Kalman filter incorporating offline metrologyMICRON TECHNOLOGY INC·Filed 2005·Granted Feb 12, 2008·6 cites·20 claims
- 1080US5588359AMethod for forming a screen for screen printing a pattern of small closely spaced features onto a substrateMICRON DISPLAY TECH INC·Filed 1995·Granted Dec 31, 1996·45 cites·22 claims
- 1174US8183157B2Method of forming capacitors, and methods of utilizing silicon dioxide-containing masking structuresRANA NARAJI B·Filed 2011·Granted May 22, 2012·4 cites·20 claims
- 1274US7892937B2Methods of forming capacitorsMICRON TECHNOLOGY INC·Filed 2008·Granted Feb 22, 2011·3 cites·27 claims
- 1371US5785569AMethod for manufacturing hollow spacersMICRON TECHNOLOGY INC·Filed 1996·Granted Jul 28, 1998·23 cites·29 claims
- 1469US6720266B2Methods and apparatuses for monitoring and controlling mechanical or chemical-mechanical planarization of microelectronic substrate assembliesMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 13, 2004·6 cites·6 claims
- 1566US6858538B2Methods and apparatuses for monitoring and controlling mechanical or chemical-mechanical planarization of microelectronic substrate assembliesMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 22, 2005·5 cites·2 claims
- 1663US7087527B2Extended kalman filter incorporating offline metrologyMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 8, 2006·6 cites·13 claims
- 1759US7261832B2Methods and apparatuses for monitoring and controlling mechanical or chemical-mechanical planarization of microelectronic substrate assembliesMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 28, 2007·3 cites·6 claims
- 1852US8026148B2Methods of utilizing silicon dioxide-containing masking structuresMICRON TECHNOLOGY INC·Filed 2011·Granted Sep 27, 2011·0 cites·13 claims
- 1951US2006246820A1Extended kalman filter incorporating offline metrologyMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 2050US2006191870A1Extended kalman filter incorporating offline metrologyMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
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