P

Inventor

YANO HIROYUKI

JP152 patents
⚠️ This page may combine multiple inventors who share the name “YANO HIROYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOSHIBA KK

37 patents
US5534106AJul 9, 1996

Apparatus for processing semiconductor wafers

TOSHIBA KK180 citations99
US5302240AApr 12, 1994

Method of manufacturing semiconductor device

TOSHIBA KK200 citations99
US6740590B1May 25, 2004

Aqueous dispersion, aqueous dispersion for chemical mechanical polishing used for manufacture of semiconductor devices, method for manufacture of semiconductor devices, and method for formation of embedded writing

TOSHIBA KK102 citations98
US6454819B1Sep 24, 2002

Composite particles and production process thereof, aqueous dispersion, aqueous dispersion composition for chemical mechanical polishing, and process for manufacture of semiconductor device

TOSHIBA KK108 citations98
US6375545B1Apr 23, 2002

Chemical mechanical method of polishing wafer surfaces

TOSHIBA KK131 citations98
US5775980AJul 7, 1998

Polishing method and polishing apparatus

TOSHIBA KK105 citations98
US5607718AMar 4, 1997

Polishing method and polishing apparatus

TOSHIBA KK119 citations98
US5483568AJan 9, 1996

Pad condition and polishing rate monitor using fluorescence

TOSHIBA KK129 citations98
US6268641B1Jul 31, 2001

Semiconductor wafer having identification indication and method of manufacturing the same

TOSHIBA KK51 citations96
US5948205ASep 7, 1999

Polishing apparatus and method for planarizing layer on a semiconductor wafer

TOSHIBA KK41 citations96
US5914275AJun 22, 1999

Polishing apparatus and method for planarizing layer on a semiconductor wafer

TOSHIBA KK43 citations96
US5721173AFeb 24, 1998

Method of forming a shallow trench isolation structure

TOSHIBA KK76 citations96
US5707487AJan 13, 1998

Method of manufacturing semiconductor device

TOSHIBA KK73 citations96
US5597341AJan 28, 1997

Semiconductor planarizing apparatus

TOSHIBA KK60 citations96
US5445996AAug 29, 1995

Method for planarizing a semiconductor device having a amorphous layer

TOSHIBA KK87 citations96
US5445710AAug 29, 1995

Method of manufacturing semiconductor device

TOSHIBA KK86 citations96
US5398459AMar 21, 1995

Method and apparatus for polishing a workpiece

TOSHIBA KK74 citations96
US5240554AAug 31, 1993

Method of manufacturing semiconductor device

TOSHIBA KK59 citations96
US7166017B2Jan 23, 2007

Slurry for CMP, polishing method and method of manufacturing semiconductor device

TOSHIBA KK23 citations93
US6924236B2Aug 2, 2005

Manufacturing method of semiconductor device

TOSHIBA KK23 citations93
US6858539B2Feb 22, 2005

Post-CMP treating liquid and method for manufacturing semiconductor device

TOSHIBA KK24 citations93
US6794285B2Sep 21, 2004

Slurry for CMP, and method of manufacturing semiconductor device

TOSHIBA KK19 citations93
US6611060B1Aug 26, 2003

Semiconductor device having a damascene type wiring layer

TOSHIBA KK26 citations93
US6414499B2Jul 2, 2002

Method for monitoring the shape of the processed surfaces of semiconductor devices and equipment for manufacturing the semiconductor devices

TOSHIBA KK23 citations93
US5954570ASep 21, 1999

Conditioner for a polishing tool

TOSHIBA KK24 citations93
US5733713AMar 31, 1998

Method of manufacturing semiconductor device

TOSHIBA KK22 citations93
US5593537AJan 14, 1997

Apparatus for processing semiconductor wafers

TOSHIBA KK37 citations93
US5437961AAug 1, 1995

Method of manufacturing semiconductor device

TOSHIBA KK29 citations93
US7217662B2May 15, 2007

Method of processing a substrate

TOSHIBA KK26 citations92
US7108589B2Sep 19, 2006

Polishing apparatus and method

TOSHIBA KK14 citations92
US7042099B2May 9, 2006

Semiconductor device containing a dummy wire

TOSHIBA KK35 citations92
US6935928B2Aug 30, 2005

Chemical mechanical polishing aqueous dispersion and chemical mechanical polishing method

TOSHIBA KK24 citations92
US6858936B2Feb 22, 2005

Semiconductor device having an improved construction in the interlayer insulating film

TOSHIBA KK15 citations92
US6576554B2Jun 10, 2003

Slurry for CMP, method of forming thereof and method of manufacturing semiconductor device including a CMP process

TOSHIBA KK25 citations92
US6429134B1Aug 6, 2002

Method of manufacturing semiconductor device

TOSHIBA KK33 citations92
US6312321B1Nov 6, 2001

Polishing apparatus

TOSHIBA KK22 citations92
US5876273AMar 2, 1999

Apparatus for polishing a wafer

TOSHIBA KK30 citations92

DAIO SEISHI KK

3 patents

KUMIAI CHEMICAL INDUSTRY CO

2 patents

EBARA CORP

2 patents

KABUSHKI KAISHA TOSHIBA

1 patent

SUMITOMO RUBBER IND

1 patent

JSR CORP

1 patent

ASAHI CHEMICAL IND

1 patent

AISIN SEIKI

1 patent

MITSUBISHI ELECTRIC CORP

1 patent

Showing the top 50 of 152 patents by PatentIndex Score.