Inventor · disambiguated record
Hideyuki Furukawa
Also filed as: FURUKAWA HIDEYUKI
8 granted patents·1 pending application·155 citations·filing 2000–2003
88Inventor score
Top patents by PatentIndex Score
9 records- 0186US6937526B2Memory card enabling simplified test process and memory card test methodFUJITSU LTD·Filed 2003·Granted Aug 30, 2005·45 cites·6 claims
- 0273US6990623B2Method for error detection/correction of multilevel cell memory and multilevel cell memory having error detection/correction functionFUJITSU LTD·Filed 2002·Granted Jan 24, 2006·21 cites·17 claims
- 0371US6862672B1Semiconductor memory device and method of controlling sameFUJITSU LTD·Filed 2000·Granted Mar 1, 2005·24 cites·7 claims
- 0470US6631276B1Base unit of radio terminalMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Oct 7, 2003·27 cites·35 claims
- 0565US6697287B2Memory controller and memory system apparatusFUJITSU LTD·Filed 2002·Granted Feb 24, 2004·12 cites·6 claims
- 0663US6957377B2Marking of and searching for initial defective blocks in semiconductor memoryFUJITSU LTD·Filed 2001·Granted Oct 18, 2005·14 cites·5 claims
- 0755US7046574B2Memory systemFUJITSU LTD·Filed 2002·Granted May 16, 2006·5 cites·9 claims
- 0854US7233994B1Network connection apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Jun 19, 2007·7 cites·6 claims
- 0940US2002174397A1Method for error detection/correction of multilevel cell memory and multilevel cell memory having error detection/correction functionFUJITSU LTD·Filed 2001·Application pending·0 cites
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