Inventor

ITAGAKI YOHSUKE

JP4 patents

⚠️ This page may combine multiple inventors who share the name “ITAGAKI YOHSUKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FAB SOLUTIONS INC

2 patents

US6943043B2Sep 13, 2005

Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device

FAB SOLUTIONS INC8 citations72

US6753194B2Jun 22, 2004

Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device

FAB SOLUTIONS INC5 citations72

TOPCON CORP

2 patents

US7795593B2Sep 14, 2010

Surface contamination analyzer for semiconductor wafers

TOPCON CORP2 citations61

US7700380B2Apr 20, 2010

Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device

TOPCON CORP2 citations61