Inventor
PARK JONG JU
KR20 patents
⚠️ This page may combine multiple inventors who share the name “PARK JONG JU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SK HYNIX INC
14 patentsUS10853236B2Dec 1, 2020
Storage device and method for operating the same
SK HYNIX INC2 citations71
US9754675B2Sep 5, 2017
Memory system and operation method thereof
SK HYNIX INC2 citations71
US9582196B2Feb 28, 2017
Memory system
SK HYNIX INC2 citations71
US11675543B2Jun 13, 2023
Apparatus and method for processing data in memory system
SK HYNIX INC0 citations61
US11243713B2Feb 8, 2022
Apparatus and method for processing data in memory system
SK HYNIX INC0 citations61
US9164833B2Oct 20, 2015
Data storage device, operating method thereof and data processing system including the same
SK HYNIX INC2 citations61
US9128890B2Sep 8, 2015
Semiconductor memory system and method for controlling order of access operation on a plurality of memory devices of multi-plane array
SK HYNIX INC3 citations61
US10884922B2Jan 5, 2021
Storage device and method of operating the same
SK HYNIX INC1 citations60
US9372741B2Jun 21, 2016
Data storage device and operating method thereof
SK HYNIX INC2 citations60
US9606811B2Mar 28, 2017
Operating method of data storage device
SK HYNIX INC0 citations52
US9583194B2Feb 28, 2017
Memory system and operating method thereof
SK HYNIX INC0 citations51
US9684352B2Jun 20, 2017
Memory system and operating method thereof
SK HYNIX INC1 citations50
US10037159B2Jul 31, 2018
Memory system and operating method thereof
SK HYNIX INC0 citations41
US10073702B2Sep 11, 2018
Memory system, computing system including the same and method of operating memory system
SK HYNIX INC0 citations40
SAMSUNG ELECTRONICS CO LTD
6 patentsUS10726541B2Jul 28, 2020
Inspection apparatus for detecting defects in photomasks and dies
SAMSUNG ELECTRONICS CO LTD2 citations69
US11829063B2Nov 28, 2023
Reflective photomask and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations60
US11727557B2Aug 15, 2023
Inspection apparatus for detecting defects in photomasks and dies
SAMSUNG ELECTRONICS CO LTD0 citations59
US11354798B2Jun 7, 2022
Inspection apparatus for detecting defects in photomasks and dies
SAMSUNG ELECTRONICS CO LTD0 citations59
US8779403B2Jul 15, 2014
Apparatus and method for generating extreme ultra violet radiation
SAMSUNG ELECTRONICS CO LTD1 citations48
US10782254B2Sep 22, 2020
Method of detecting a defect and apparatus for performing the same
SAMSUNG ELECTRONICS CO LTD0 citations36