Inventor

HUOTT WILLIAM

US3 patents

Patents

3 patents

US10971242B2Apr 6, 2021

Sequential error capture during memory test

IBM2 citations70

US10998075B2May 4, 2021

Built-in self-test for bit-write enabled memory arrays

IBM2 citations68

US10890623B1Jan 12, 2021

Power saving scannable latch output driver

IBM2 citations66