Inventor
HIMEDA AKIHIRO
JP11 patents
⚠️ This page may combine multiple inventors who share the name “HIMEDA AKIHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
RIGAKU DENKI CO LTD
10 patentsUS7130373B2Oct 31, 2006
Method and apparatus for film thickness measurement
RIGAKU DENKI CO LTD42 citations91
US10161888B2Dec 25, 2018
Crystalline phase identification method, crystalline phase identification device, and X-ray diffraction measurement system
RIGAKU DENKI CO LTD6 citations71
US10801976B2Oct 13, 2020
Method for displaying measurement results from x-ray diffraction measurement
RIGAKU DENKI CO LTD1 citations61
US10962489B2Mar 30, 2021
Quantitative phase analysis device, quantitative phase analysis method, and quantitative phase analysis program
RIGAKU DENKI CO LTD1 citations60
US10876979B2Dec 29, 2020
Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction
RIGAKU DENKI CO LTD1 citations59
US12174131B2Dec 24, 2024
Quantitative analysis apparatus, method and program and manufacturing control system
RIGAKU DENKI CO LTD1 citations53
US11300529B2Apr 12, 2022
Analysis apparatus, analysis method and analysis program
RIGAKU DENKI CO LTD0 citations46
US12584871B2Mar 24, 2026
Information processing apparatus, information processing method, nontransitory computer readable media storing program, and X-ray analysis apparatus
RIGAKU DENKI CO LTD0 citations42
US12566146B2Mar 3, 2026
Information processing apparatus, information processing method, non-transitory computer readable media storing program, and X-ray analysis apparatus
RIGAKU DENKI CO LTD0 citations42
US10393679B2Aug 27, 2019
Operation guide system for X-ray analysis,operation guide method therefor, and operation guide program therefor
RIGAKU DENKI CO LTD0 citations39