Inventor

LEE CHRIS W

US4 patents

⚠️ This page may combine multiple inventors who share the name “LEE CHRIS W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WU KENONG

1 patent

US9310316B2Apr 12, 2016

Selecting parameters for defect detection methods

WU KENONG15 citations80

KLA TENCOR CORP

1 patent

US8948494B2Feb 3, 2015

Unbiased wafer defect samples

KLA TENCOR CORP6 citations70

DISHNER MARK

1 patent

US9037280B2May 19, 2015

Computer-implemented methods for performing one or more defect-related functions

DISHNER MARK2 citations51

LEE CHRIS W

1 patent

US8392136B2Mar 5, 2013

In-place management of semiconductor equipment recipes

LEE CHRIS W0 citations33