Inventor

TIEN YAN-WEI

TW2 patents

⚠️ This page may combine multiple inventors who share the name “TIEN YAN-WEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG

1 patent

US8965102B2Feb 24, 2015

System and method for defect analysis of a substrate

TAIWAN SEMICONDUCTOR MFG8 citations80

TIEN YAN-WEI

1 patent

US9269135B2Feb 23, 2016

Defect management systems and methods

TIEN YAN-WEI0 citations37