P

Inventor

WERHANE KEVIN G

US17 patents

Patents

17 patents
US10330726B2Jun 25, 2019

Apparatuses including test segment circuits having latch circuits for testing a semiconductor die

MICRON TECHNOLOGY INC6 citations83
US11263078B2Mar 1, 2022

Apparatuses, systems, and methods for error correction

MICRON TECHNOLOGY INC1 citations71
US11183260B1Nov 23, 2021

Transmit line monitoring circuitry, and related methods, devices, and systems

MICRON TECHNOLOGY INC4 citations70
US12394456B2Aug 19, 2025

Apparatuses and methods including dice latches in a semiconductor device

MICRON TECHNOLOGY INC0 citations62
US11955160B2Apr 9, 2024

Asynchronous signal to command timing calibration for testing accuracy

MICRON TECHNOLOGY INC0 citations62
US11727967B2Aug 15, 2023

Apparatuses and methods including dice latches in a semiconductor device

MICRON TECHNOLOGY INC1 citations62
US11342042B2May 24, 2022

Interconnected command/address resources

MICRON TECHNOLOGY INC0 citations62
US11054468B2Jul 6, 2021

Segmented digital die ring

MICRON TECHNOLOGY INC0 citations62
US10663513B2May 26, 2020

Apparatuses including test segment circuits having latch circuits for testing a semiconductor die

MICRON TECHNOLOGY INC1 citations62
US12079076B2Sep 3, 2024

Apparatuses, systems, and methods for error correction

MICRON TECHNOLOGY INC0 citations61
US11675589B2Jun 13, 2023

Serial interfaces with shadow registers, and associated systems, devices, and methods

MICRON TECHNOLOGY INC0 citations61
US12100467B2Sep 24, 2024

Systems and methods for testing redundant fuse latches in a memory device

MICRON TECHNOLOGY INC0 citations60
US11081166B1Aug 3, 2021

Memory device random option inversion

MICRON TECHNOLOGY INC0 citations60
US12100476B2Sep 24, 2024

Test mode security circuit

MICRON TECHNOLOGY INC0 citations59
US10930327B1Feb 23, 2021

Memory read masking

MICRON TECHNOLOGY INC0 citations58
US11645134B2May 9, 2023

Apparatuses and methods for fuse error detection

MICRON TECHNOLOGY INC0 citations51
US12333191B2Jun 17, 2025

Apparatus with calibration input mechanism and methods for operating the same

MICRON TECHNOLOGY INC0 citations48