Inventor
WERHANE KEVIN G
US17 patents
Patents
17 patentsUS10330726B2Jun 25, 2019
Apparatuses including test segment circuits having latch circuits for testing a semiconductor die
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US11263078B2Mar 1, 2022
Apparatuses, systems, and methods for error correction
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US11183260B1Nov 23, 2021
Transmit line monitoring circuitry, and related methods, devices, and systems
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US12394456B2Aug 19, 2025
Apparatuses and methods including dice latches in a semiconductor device
MICRON TECHNOLOGY INC0 citations62
US11955160B2Apr 9, 2024
Asynchronous signal to command timing calibration for testing accuracy
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US11727967B2Aug 15, 2023
Apparatuses and methods including dice latches in a semiconductor device
MICRON TECHNOLOGY INC1 citations62
US11342042B2May 24, 2022
Interconnected command/address resources
MICRON TECHNOLOGY INC0 citations62
US11054468B2Jul 6, 2021
Segmented digital die ring
MICRON TECHNOLOGY INC0 citations62
US10663513B2May 26, 2020
Apparatuses including test segment circuits having latch circuits for testing a semiconductor die
MICRON TECHNOLOGY INC1 citations62
US12079076B2Sep 3, 2024
Apparatuses, systems, and methods for error correction
MICRON TECHNOLOGY INC0 citations61
US11675589B2Jun 13, 2023
Serial interfaces with shadow registers, and associated systems, devices, and methods
MICRON TECHNOLOGY INC0 citations61
US12100467B2Sep 24, 2024
Systems and methods for testing redundant fuse latches in a memory device
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US11081166B1Aug 3, 2021
Memory device random option inversion
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US12100476B2Sep 24, 2024
Test mode security circuit
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US10930327B1Feb 23, 2021
Memory read masking
MICRON TECHNOLOGY INC0 citations58
US11645134B2May 9, 2023
Apparatuses and methods for fuse error detection
MICRON TECHNOLOGY INC0 citations51
US12333191B2Jun 17, 2025
Apparatus with calibration input mechanism and methods for operating the same
MICRON TECHNOLOGY INC0 citations48