Inventor

BEVAN MALCOLM J

US43 patents

⚠️ This page may combine multiple inventors who share the name “BEVAN MALCOLM J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BEVAN MALCOLM J

TEXAS INSTRUMENTS INC

Gate dielectric and method

Sidewall processes using alkylsilane precursors for MOS transistor fabrication

Integrated circuits with composite gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

Post high voltage gate dielectric pattern plasma surface treatment

Post high voltage gate oxide pattern high-vacuum outgas surface treatment

Dual-gate integrated circuit semiconductor device

Thermal treatment of nitrided oxide to improve negative bias thermal instability

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

Post high voltage gate oxide pattern high-vacuum outgas surface treatment

APPLIED MATERIALS INC

Edge ring

Method and apparatus for single step selective nitridation

Method and apparatus for selective nitridation process

Film thickness uniformity improvement using edge ring and bias electrode geometry

Treatments to enhance material structures

Methods for calibrating an optical emission spectrometer

Methods for calibrating an optical emission spectrometer

Gate all around I/O engineering

Gate interface engineering with doped layer

Gate all around I/O engineering

Film thickness uniformity improvement using edge ring and bias electrode geometry

Cap oxidation for FinFET formation

Integrated wet clean for gate stack development

BEVAN MALCOLM J

System and method for mitigating oxide growth in a gate dielectric

Methods and apparatus for forming nitrogen-containing layers

Methods and apparatus for forming nitrogen-containing layers

RAYTHEON CO

Room temperature 3-5 micrometer wavelength HgCdTe heterojunction emitter

Uncooled infrared sensors for the detection and identification of chemical products of combustion

RAYTHEON TI SYST INC

Method of forming a cadmium telluride/silicon structure

TEXAS INSRUMENTS INC

Bolometer autocalibration

LIU WEI

NH3 containing plasma nitridation of a layer on a substrate

SATO TATSUYA E

In situ vapor phase surface activation of SiO2

GANGULY UDAYAN

Method and apparatus for single step selective nitridation

DRS TECHNOLOGIES INC

Method of forming a cadmium telluride/silicon structure

ROGERS MATTHEW S

Method and apparatus for selective nitridation process