Inventor
BHAVSAR DILIP K
US8 patents
⚠️ This page may combine multiple inventors who share the name “BHAVSAR DILIP K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
DIGITAL EQUIPMENT CORP
3 patentsUS5627842AMay 6, 1997
Architecture for system-wide standardized intra-module and inter-module fault testing
DIGITAL EQUIPMENT CORP246 citations96
US4669061AMay 26, 1987
Scannable flip-flop
DIGITAL EQUIPMENT CORP54 citations95
US6076176AJun 13, 2000
Encoding of failing bit addresses to facilitate multi-bit failure detect using a wired-OR scheme
DIGITAL EQUIPMENT CORP10 citations68
COMPAQ COMPUTER CORP
2 patentsUS6286116B1Sep 4, 2001
Built-in test method for content addressable memories
COMPAQ COMPUTER CORP42 citations91
US6163864ADec 19, 2000
Method for cost-effective production testing of input voltage levels of the forwarded clock interface of high performance integrated circuits
COMPAQ COMPUTER CORP44 citations90