Inventor
OHTAKE HIDEYUKI
JP11 patents
⚠️ This page may combine multiple inventors who share the name “OHTAKE HIDEYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AISIN SEIKI
5 patentsUS7488940B2Feb 10, 2009
Reflection type terahertz spectrometer and spectrometric method
AISIN SEIKI18 citations83
US7221451B2May 22, 2007
Multi-channeled measuring method and apparatus for measuring spectrum of terahertz pulse
AISIN SEIKI8 citations69
US7177071B2Feb 13, 2007
Semiconductor crystal for generating terahertz waves, terahertz wave-generator incorporating the crystal, semiconductor crystal for detecting terahertz waves, and terahertz waves detector incorporating the crystal
AISIN SEIKI7 citations66
US7593099B2Sep 22, 2009
Method and device for configuration examination
AISIN SEIKI4 citations58
US7466151B2Dec 16, 2008
Electric-field distribution measurement method and apparatus for semiconductor device
AISIN SEIKI0 citations38
OHTAKE HIDEYUKI
3 patentsUS8513608B2Aug 20, 2013
Coating film inspection apparatus and inspection method
OHTAKE HIDEYUKI9 citations79
US8497490B2Jul 30, 2013
Terahertz wave generation device and method for generating terahertz wave
OHTAKE HIDEYUKI1 citations49
US8450689B2May 28, 2013
Device and method for measuring thickness of paint film in non-contacting manner
OHTAKE HIDEYUKI1 citations48