Inventor
YANG TA-HONE
TW10 patents
⚠️ This page may combine multiple inventors who share the name “YANG TA-HONE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MACRONIX INT CO LTD
8 patentsUS9466610B1Oct 11, 2016
Method of fabricating three-dimensional gate-all-around vertical gate structures and semiconductor devices, and three-dimensional gate-all-round vertical gate structures and semiconductor devices thereof
MACRONIX INT CO LTD8 citations81
US9589086B2Mar 7, 2017
Method for measuring and analyzing surface structure of chip or wafer
MACRONIX INT CO LTD5 citations71
US9006003B1Apr 14, 2015
Method of detecting bitmap failure associated with physical coordinate
MACRONIX INT CO LTD3 citations61
US9349746B1May 24, 2016
Method of fabricating deep trench semiconductor devices, and deep trench semiconductor devices
MACRONIX INT CO LTD2 citations60
US9116108B1Aug 25, 2015
Electron beam inspection optimization
MACRONIX INT CO LTD1 citations51
US9244112B2Jan 26, 2016
Method for detecting an electrical defect of contact/via plugs
MACRONIX INT CO LTD1 citations50
US9305794B2Apr 5, 2016
Etching method and etching composition
MACRONIX INT CO LTD0 citations49
US9869712B2Jan 16, 2018
Method and system for detecting defects of wafer by wafer sort
MACRONIX INT CO LTD0 citations41