Inventor
SAVITHRI NAGARAJ NARASIMH
US4 patents
Patents
4 patentsUS6700399B1Mar 2, 2004
High density parasitic measurement structure
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US7129696B2Oct 31, 2006
Method for capacitance measurement in silicon
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US7109738B2Sep 19, 2006
Method for modeling inductive effects on circuit performance
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US7318208B2Jan 8, 2008
Method for circuit sensitivity driven parasitic extraction
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