Inventor
RITSCHEL KAI
DE10 patents
Patents
10 patentsUS12313830B2May 27, 2025
Method for adjusting the illumination in a fluorescence microscope, and corresponding fluorescence microscope
LEICA MICROSYSTEMS2 citations72
US12253663B2Mar 18, 2025
Control device for a microscope
LEICA MICROSYSTEMS2 citations67
US12339229B2Jun 24, 2025
Method of analyzing a mixed fluorescence response of a plurality of fluorophores, fluorescence analyzer, fluorescence microscope and computer program
LEICA MICROSYSTEMS1 citations58
US12393011B2Aug 19, 2025
Optical imaging system, methods, systems, and computer programs
LEICA MICROSYSTEMS0 citations56
US12571736B2Mar 10, 2026
Control system and method for determining an illumination intensity in a fluorescence microscope and corresponding microscope system
LEICA MICROSYSTEMS0 citations50
US12277719B2Apr 15, 2025
Multispectral microscope system and method for registering first and second images by means thereof
LEICA MICROSYSTEMS0 citations47
US11543644B2Jan 3, 2023
Digital imaging device and method for generating a digital color image
LEICA MICROSYSTEMS0 citations46
US12366741B2Jul 22, 2025
Control device for a microscope
LEICA MICROSYSTEMS0 citations45
US11841494B2Dec 12, 2023
Optical imaging device for a microscope
LEICA MICROSYSTEMS0 citations43
US12436373B2Oct 7, 2025
Fluorescence microscope system and method
LEICA MICROSYSTEMS0 citations42