Inventor
HASEYAMA MAKOTO
JP26 patents
⚠️ This page may combine multiple inventors who share the name “HASEYAMA MAKOTO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJITSU LTD
24 patentsUS6661247B2Dec 9, 2003
Semiconductor testing device
FUJITSU LTD41 citations96
US6466046B1Oct 15, 2002
Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor
FUJITSU LTD56 citations96
US6229320B1May 8, 2001
IC socket, a test method using the same and an IC socket mounting mechanism
FUJITSU LTD82 citations96
US6033233AMar 7, 2000
Electrical connecting device, and semiconductor device testing method
FUJITSU LTD82 citations95
US7112889B1Sep 26, 2006
Semiconductor device having an alignment mark formed by the same material with a metal post
FUJITSU LTD36 citations92
US6630839B1Oct 7, 2003
Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor
FUJITSU LTD19 citations92
US6624645B2Sep 23, 2003
Semiconductor device testing method, using a spring-biased transformable conductive member electrode connection
FUJITSU LTD40 citations92
US6555764B1Apr 29, 2003
Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor
FUJITSU LTD36 citations92
US6535002B2Mar 18, 2003
IC socket, a test method using the same and an IC socket mounting mechanism
FUJITSU LTD36 citations92
US6445200B2Sep 3, 2002
Semiconductor element testing carrier using a membrane contactor and a semiconductor element testing method and apparatus using such a carrier
FUJITSU LTD30 citations92
US6249135B1Jun 19, 2001
Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage
FUJITSU LTD34 citations92
US6046598AApr 4, 2000
Test board and a test method using the same providing improved electrical connection
FUJITSU LTD27 citations92
US6781395B2Aug 24, 2004
Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor
FUJITSU LTD13 citations84
US6882169B2Apr 19, 2005
Semiconductor testing device
FUJITSU LTD6 citations74
US6512386B2Jan 28, 2003
Device testing contactor, method of producing the same, and device testing carrier
FUJITSU LTD5 citations74
US6603325B2Aug 5, 2003
Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor
FUJITSU LTD10 citations73
US6191604B1Feb 20, 2001
Integrated circuit testing device
FUJITSU LTD11 citations73
US7196530B2Mar 27, 2007
Device testing contactor, method of producing the same, and device testing carrier
FUJITSU LTD2 citations63
US7161370B2Jan 9, 2007
Semiconductor testing device
FUJITSU LTD2 citations63
US7028398B2Apr 18, 2006
Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor
FUJITSU LTD4 citations63
US6975126B2Dec 13, 2005
Contactor apparatus for semiconductor devices and a test method of semiconductor devices
FUJITSU LTD3 citations63
US6643922B2Nov 11, 2003
Device testing contactor, method of producing the same, and device testing carrier
FUJITSU LTD1 citations63
US7174629B2Feb 13, 2007
Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor
FUJITSU LTD2 citations62
US7304487B2Dec 4, 2007
Test method of semiconductor devices
FUJITSU LTD0 citations52