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Inventor
ZHANG KANGPING
US
2 patents
Patents
2 patents
US7728361B2
Jun 1, 2010
Method of testing an integrated circuit die, and an integrated circuit die
SILICON STORAGE TECH INC
2 citations
55
US7851273B2
Dec 14, 2010
Method of testing an integrated circuit die, and an integrated circuit die
SILICON STORAGE TECH INC
0 citations
45