Inventor
KOBAYASHI NORIFUMI
JP7 patents
⚠️ This page may combine multiple inventors who share the name “KOBAYASHI NORIFUMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
5 patentsUS6812727B2Nov 2, 2004
Semiconductor integrated circuit device and testing method thereof
TOSHIBA KK30 citations90
US6499334B1Dec 31, 2002
Variable delay element test circuit
TOSHIBA KK26 citations90
US6057691AMay 2, 2000
Delay element testing apparatus and integrated circuit having testing function for delay elements
TOSHIBA KK24 citations90
US6184735B1Feb 6, 2001
Variable delay circuit
TOSHIBA KK5 citations60
US6029260AFeb 22, 2000
Memory analyzing apparatus
TOSHIBA KK4 citations56