Inventor
STRID ERIC W
US31 patents
⚠️ This page may combine multiple inventors who share the name “STRID ERIC W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CASCADE MICROTECH INC
28 patentsUS6815963B2Nov 9, 2004
Probe for testing a device under test
CASCADE MICROTECH INC80 citations99
US4849689AJul 18, 1989
Microwave wafer probe having replaceable probe tip
CASCADE MICROTECH INC148 citations99
US7161363B2Jan 9, 2007
Probe for testing a device under test
CASCADE MICROTECH INC64 citations98
US5869975AFeb 9, 1999
System for evaluating probing networks that have multiple probing ends
CASCADE MICROTECH INC90 citations98
US4827211AMay 2, 1989
Wafer probe
CASCADE MICROTECH INC144 citations98
US6608496B1Aug 19, 2003
Reference transmission line junction for probing device
CASCADE MICROTECH INC63 citations97
US5659255AAug 19, 1997
Method of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channels
CASCADE MICROTECH INC64 citations97
US5565788AOct 15, 1996
Coaxial wafer probe with tip shielding
CASCADE MICROTECH INC197 citations97
US5561377AOct 1, 1996
System for evaluating probing networks
CASCADE MICROTECH INC84 citations97
US4697143ASep 29, 1987
Wafer probe
CASCADE MICROTECH INC257 citations97
US6130544AOct 10, 2000
System for evaluating probing networks
CASCADE MICROTECH INC54 citations96
US5973505AOct 26, 1999
System for evaluating probing networks
CASCADE MICROTECH INC61 citations96
US4858160AAug 15, 1989
System for setting reference reactance for vector corrected measurements
CASCADE MICROTECH INC112 citations96
US4764723AAug 16, 1988
Wafer probe
CASCADE MICROTECH INC103 citations96
US7482823B2Jan 27, 2009
Shielded probe for testing a device under test
CASCADE MICROTECH INC11 citations92
US7436194B2Oct 14, 2008
Shielded probe with low contact resistance for testing a device under test
CASCADE MICROTECH INC10 citations92
US7321233B2Jan 22, 2008
System for evaluating probing networks
CASCADE MICROTECH INC14 citations92
US7304488B2Dec 4, 2007
Shielded probe for high-frequency testing of a device under test
CASCADE MICROTECH INC19 citations92
US5047725ASep 10, 1991
Verification and correction method for an error model for a measurement network
CASCADE MICROTECH INC53 citations91
US4998071AMar 5, 1991
Noise parameter test method and apparatus
CASCADE MICROTECH INC22 citations91
US7609077B2Oct 27, 2009
Differential signal probe with integral balun
CASCADE MICROTECH INC13 citations84
US7518387B2Apr 14, 2009
Shielded probe for testing a device under test
CASCADE MICROTECH INC9 citations84
US7489149B2Feb 10, 2009
Shielded probe for testing a device under test
CASCADE MICROTECH INC8 citations84
US4891612AJan 2, 1990
Overlap interfaces between coplanar transmission lines which are tolerant to transverse and longitudinal misalignment
CASCADE MICROTECH INC11 citations74
US7164279B2Jan 16, 2007
System for evaluating probing networks
CASCADE MICROTECH INC5 citations73
US6987398B2Jan 17, 2006
System for evaluating probing networks
CASCADE MICROTECH INC4 citations73
US6803779B2Oct 12, 2004
Interconnect assembly for use in evaluating probing networks
CASCADE MICROTECH INC3 citations73
US5068615ANov 26, 1991
Noise parameter test apparatus
CASCADE MICROTECH INC9 citations72