Inventor
HYDE MATTHEW STEVEN
US4 patents
Patents
4 patentsUS10998075B2May 4, 2021
Built-in self-test for bit-write enabled memory arrays
IBM2 citations68
US11081202B2Aug 3, 2021
Failing address registers for built-in self tests
IBM1 citations61
US11657887B2May 23, 2023
Testing bit write operation to a memory array in integrated circuits
IBM0 citations50
US11069422B1Jul 20, 2021
Testing multi-port array in integrated circuits
IBM0 citations50