P

Inventor

OHBAYASHI SHIGEKI

JP66 patents
⚠️ This page may combine multiple inventors who share the name “OHBAYASHI SHIGEKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

34 patents
US5124589AJun 23, 1992

Semiconductor integrated circuit capable of synchronous and asynchronous operations and operating method therefor

MITSUBISHI ELECTRIC CORP172 citations99
US5991223ANov 23, 1999

Synchronous semiconductor memory device operable in a burst mode

MITSUBISHI ELECTRIC CORP86 citations96
US5666324ASep 9, 1997

Clock synchronous semiconductor memory device having current consumption reduced

MITSUBISHI ELECTRIC CORP61 citations95
US5659513AAug 19, 1997

Static semiconductor memory device having improved characteristics

MITSUBISHI ELECTRIC CORP31 citations95
US5544105AAug 6, 1996

Static semiconductor memory device having circuitry for lowering potential of bit lines at commencement of data writing

MITSUBISHI ELECTRIC CORP29 citations95
US5491655AFeb 13, 1996

Semiconductor memory device having non-selecting level generation circuitry for providing a low potential during reading mode and high level potential during another operation mode

MITSUBISHI ELECTRIC CORP38 citations95
US6388857B1May 14, 2002

Semiconductor circuit device with improved surge resistance

MITSUBISHI ELECTRIC CORP18 citations93
US6373760B1Apr 16, 2002

Static type semiconductor memory device adopting a redundancy system

MITSUBISHI ELECTRIC CORP31 citations93
US5602798AFeb 11, 1997

Synchronous semiconductor memory device operable in a snooze mode

MITSUBISHI ELECTRIC CORP28 citations93
US5555522ASep 10, 1996

Semiconductor memory having redundant cells

MITSUBISHI ELECTRIC CORP36 citations93
US5216298AJun 1, 1993

ECL input buffer for BiCMOS

MITSUBISHI ELECTRIC CORP25 citations93
US6574159B2Jun 3, 2003

Semiconductor memory device and testing method therefor

MITSUBISHI ELECTRIC CORP51 citations92
US6556058B2Apr 29, 2003

Power on reset circuit

MITSUBISHI ELECTRIC CORP24 citations92
US6469552B2Oct 22, 2002

Power on reset circuit

MITSUBISHI ELECTRIC CORP23 citations92
US6229365B1May 8, 2001

Semiconductor integrated circuit device operating stably at a plurality of power supply voltage levels

MITSUBISHI ELECTRIC CORP21 citations92
US6141269AOct 31, 2000

Semiconductor integrated circuit device using BiCMOS technology

MITSUBISHI ELECTRIC CORP40 citations92
US5703510ADec 30, 1997

Power on reset circuit for generating reset signal at power on

MITSUBISHI ELECTRIC CORP42 citations92
US5663905ASep 2, 1997

Semiconductor memory device comprising two kinds of memory cells operating in different access speeds and methods of operating and manufacturing the same

MITSUBISHI ELECTRIC CORP35 citations92
US5629900AMay 13, 1997

Semiconductor memory device operable to write data accurately at high speed

MITSUBISHI ELECTRIC CORP20 citations92
US5506805AApr 9, 1996

Static semiconductor memory device having circuitry for enlarging write recovery margin

MITSUBISHI ELECTRIC CORP25 citations92
US5274597ADec 28, 1993

Semiconductor memory device capable of driving divided word lines at high speed

MITSUBISHI ELECTRIC CORP37 citations92
US5684750ANov 4, 1997

Semiconductor memory device with a sense amplifier including two types of amplifiers

MITSUBISHI ELECTRIC CORP52 citations87
US6479860B2Nov 12, 2002

Semiconductor memory device

MITSUBISHI ELECTRIC CORP18 citations84
US6320802B1Nov 20, 2001

Program circuit suppressing stand-by current and permitting highly reliable operation, and semiconductor memory device using the program circuit

MITSUBISHI ELECTRIC CORP18 citations84
US5515326AMay 7, 1996

Static semiconductor memory device having circuitry for lowering potential of bit lines at commencement of data writing

MITSUBISHI ELECTRIC CORP16 citations81
US6521951B2Feb 18, 2003

Semiconductor circuit device with improved surge resistance

MITSUBISHI ELECTRIC CORP13 citations77
US6597041B2Jul 22, 2003

Semiconductor static random access memory device

MITSUBISHI ELECTRIC CORP11 citations74
US6314037B1Nov 6, 2001

Semiconductor integrated circuit device using BiCMOS technology

MITSUBISHI ELECTRIC CORP12 citations74
US6301678B1Oct 9, 2001

Test circuit for reducing test time in semiconductor memory device having multiple data input/output terminals

MITSUBISHI ELECTRIC CORP11 citations74
US5781468AJul 14, 1998

Semiconductor memory device comprising two kinds of memory cells operating in different access speeds and methods of operating and manufacturing the same

MITSUBISHI ELECTRIC CORP13 citations74
US5734281AMar 31, 1998

Semiconductor integrated circuit for outputting an intermediate potential

MITSUBISHI ELECTRIC CORP9 citations74
US5138201AAug 11, 1992

Sense amplifier operable under variable power supply voltage

MITSUBISHI ELECTRIC CORP13 citations74
US4977337ADec 11, 1990

Bi-CMOS logic circuit

MITSUBISHI ELECTRIC CORP7 citations74
US6088820AJul 11, 2000

Static semiconductor memory device having test mode

MITSUBISHI ELECTRIC CORP14 citations67

RENESAS TECH CORP

10 patents

NII KOJI

2 patents

RENESAS ELECTRONICS CORP

2 patents

TOMITA HIDEMOTO

1 patent

MITSUBISHI KABUSHIKI KAISHA

1 patent

Showing the top 50 of 66 patents by PatentIndex Score.