Inventor
FORSTER JOHN C
US79 patents
⚠️ This page may combine multiple inventors who share the name “FORSTER JOHN C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
33 patentsUS6679981B1Jan 20, 2004
Inductive plasma loop enhancing magnetron sputtering
APPLIED MATERIALS INC329 citations99
US6190513B1Feb 20, 2001
Darkspace shield for improved RF transmission in inductively coupled plasma sources for sputter deposition
APPLIED MATERIALS INC90 citations98
US7048837B2May 23, 2006
End point detection for sputtering and resputtering
APPLIED MATERIALS INC68 citations97
US7504006B2Mar 17, 2009
Self-ionized and capacitively-coupled plasma for sputtering and resputtering
APPLIED MATERIALS INC49 citations96
US7253109B2Aug 7, 2007
Method of depositing a tantalum nitride/tantalum diffusion barrier layer system
APPLIED MATERIALS INC44 citations96
US6911124B2Jun 28, 2005
Method of depositing a TaN seed layer
APPLIED MATERIALS INC52 citations96
US6500762B2Dec 31, 2002
Method of depositing a copper seed layer which promotes improved feature surface coverage
APPLIED MATERIALS INC56 citations96
US6132566AOct 17, 2000
Apparatus and method for sputtering ionized material in a plasma
APPLIED MATERIALS INC80 citations96
US6660134B1Dec 9, 2003
Feedthrough overlap coil
APPLIED MATERIALS INC29 citations93
US6461483B1Oct 8, 2002
Method and apparatus for performing high pressure physical vapor deposition
APPLIED MATERIALS INC35 citations93
US6391776B1May 21, 2002
Method of depositing a copper seed layer which promotes improved feature surface coverage
APPLIED MATERIALS INC27 citations93
US6149784ANov 21, 2000
Sputtering chamber shield promoting reliable plasma ignition
APPLIED MATERIALS INC66 citations93
US6579426B1Jun 17, 2003
Use of variable impedance to control coil sputter distribution
APPLIED MATERIALS INC32 citations92
US6254746B1Jul 3, 2001
Recessed coil for generating a plasma
APPLIED MATERIALS INC47 citations92
US6723214B2Apr 20, 2004
Apparatus for improved power coupling through a workpiece in a semiconductor wafer processing system
APPLIED MATERIALS INC22 citations90
US6620296B2Sep 16, 2003
Target sidewall design to reduce particle generation during magnetron sputtering
APPLIED MATERIALS INC38 citations89
US6565717B1May 20, 2003
Apparatus for sputtering ionized material in a medium to high density plasma
APPLIED MATERIALS INC21 citations86
US6235169B1May 22, 2001
Modulated power for ionized metal plasma deposition
APPLIED MATERIALS INC17 citations84
US10879042B2Dec 29, 2020
Symmetric plasma source to generate pie shaped treatment
APPLIED MATERIALS INC5 citations83
US7686926B2Mar 30, 2010
Multi-step process for forming a metal barrier in a sputter reactor
APPLIED MATERIALS INC16 citations83
US7163607B2Jan 16, 2007
Process kit for improved power coupling through a workpiece in a semiconductor wafer processing system
APPLIED MATERIALS INC10 citations82
US7097744B2Aug 29, 2006
Method and apparatus for controlling darkspace gap in a chamber
APPLIED MATERIALS INC12 citations81
US11915918B2Feb 27, 2024
Cleaning of sin with CCP plasma or RPS clean
APPLIED MATERIALS INC4 citations74
US7687909B2Mar 30, 2010
Metal / metal nitride barrier layer for semiconductor device applications
APPLIED MATERIALS INC7 citations74
US6887786B2May 3, 2005
Method and apparatus for forming a barrier layer on a substrate
APPLIED MATERIALS INC9 citations74
US6409890B1Jun 25, 2002
Method and apparatus for forming a uniform layer on a workpiece during sputtering
APPLIED MATERIALS INC10 citations74
USD442853SMay 29, 2001
Rounded overlap coil
APPLIED MATERIALS INC8 citations74
USD442852SMay 29, 2001
Squared overlap coil
APPLIED MATERIALS INC13 citations74
US10903056B2Jan 26, 2021
Plasma source for rotating susceptor
APPLIED MATERIALS INC3 citations73
US10763085B2Sep 1, 2020
Shaped electrodes for improved plasma exposure from vertical plasma source
APPLIED MATERIALS INC5 citations73
US10692706B2Jun 23, 2020
Methods and apparatus for reducing sputtering of a grounded shield in a process chamber
APPLIED MATERIALS INC3 citations73
US10047430B2Aug 14, 2018
Self-ionized and inductively-coupled plasma for sputtering and resputtering
APPLIED MATERIALS INC5 citations73
US9984911B2May 29, 2018
Electrostatic chuck design for high temperature RF applications
APPLIED MATERIALS INC4 citations73
IBM
11 patentsUS5178739AJan 12, 1993
Apparatus for depositing material into high aspect ratio holes
IBM429 citations99
US5207437AMay 4, 1993
Ceramic electrostatic wafer chuck
IBM57 citations96
US5189446AFeb 23, 1993
Plasma wafer processing tool having closed electron cyclotron resonance
IBM58 citations96
US5312717AMay 17, 1994
Residue free vertical pattern transfer with top surface imaging resists
IBM78 citations95
US5208512AMay 4, 1993
Scanned electron cyclotron resonance plasma source
IBM34 citations92
US5284549AFeb 8, 1994
Selective fluorocarbon-based RIE process utilizing a nitrogen additive
IBM36 citations91
US5382911AJan 17, 1995
Reaction chamber interelectrode gap monitoring by capacitance measurement
IBM32 citations89
US5433258AJul 18, 1995
Gettering of particles during plasma processing
IBM15 citations82
US5332441AJul 26, 1994
Apparatus for gettering of particles during plasma processing
IBM17 citations82
US5543184AAug 6, 1996
Method of reducing particulates in a plasma tool through steady state flows
IBM10 citations73
US5518547AMay 21, 1996
Method and apparatus for reducing particulates in a plasma tool through steady state flows
IBM15 citations73
DING PEIJUN
2 patentsFORSTER JOHN C
1 patentGOPALRAJA PRABURAM
1 patentNULMAN JAIM
1 patentGUNG TZA-JING
1 patentShowing the top 50 of 79 patents by PatentIndex Score.