P

Inventor

AOKI YASUKO

JP10 patents
⚠️ This page may combine multiple inventors who share the name “AOKI YASUKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI LTD

4 patents
US5933473AAug 3, 1999

Non-destructive inspection apparatus and inspection system using it

HITACHI LTD39 citations95
US6333962B1Dec 25, 2001

Non-destructive inspection apparatus and inspection system using it

HITACHI LTD21 citations92
US6049586AApr 11, 2000

Non-destructive inspection apparatus and inspection system using it

HITACHI LTD13 citations73
US5398268AMar 14, 1995

Nuclear power plant having a water chemistry control system for a primary cooling system thereof and an operation method thereof

HITACHI LTD18 citations73

HITACHI HIGH TECH CORP

3 patents
US7705302B2Apr 27, 2010

Scanning electron microscope

HITACHI HIGH TECH CORP13 citations81
US9506876B2Nov 29, 2016

X-ray inspection device, inspection method, and X-ray detector

HITACHI HIGH TECH CORP4 citations73
US7342241B2Mar 11, 2008

Method and apparatus for electron-beam lithography

HITACHI HIGH TECH CORP2 citations59

MORISHITA HIDEO

1 patent
US8629395B2Jan 14, 2014

Charged particle beam apparatus

MORISHITA HIDEO10 citations81

AIKO KENJI

1 patent
US9164042B2Oct 20, 2015

Device for detecting foreign matter and method for detecting foreign matter

AIKO KENJI2 citations60

ICHIMURA TAKASHI

1 patent
US8455823B2Jun 4, 2013

Charged particle beam device

ICHIMURA TAKASHI2 citations57