Inventor
AMANULLAH AJHARALI
SG11 patents
⚠️ This page may combine multiple inventors who share the name “AMANULLAH AJHARALI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AMANULLAH AJHARALI
5 patentsUS8885918B2Nov 11, 2014
System and method for inspecting a wafer
AMANULLAH AJHARALI9 citations75
US9746426B2Aug 29, 2017
System and method for capturing illumination reflected in multiple directions
AMANULLAH AJHARALI2 citations70
US9863889B2Jan 9, 2018
System and method for inspecting a wafer
AMANULLAH AJHARALI4 citations69
US8401272B2Mar 19, 2013
Patterned wafer defect inspection system and method
AMANULLAH AJHARALI2 citations53
US10161881B2Dec 25, 2018
System and method for inspecting a wafer
AMANULLAH AJHARALI1 citations46
ASTI HOLDINGS LTD
3 patentsUS9934565B2Apr 3, 2018
Systems and methods for automatically verifying correct die removal from film frames
ASTI HOLDINGS LTD5 citations63
US7869021B2Jan 11, 2011
Multiple surface inspection system and method
ASTI HOLDINGS LTD2 citations54
US7768633B2Aug 3, 2010
Multiple surface inspection system and method
ASTI HOLDINGS LTD1 citations44
SEMICONDUCTOR TECH AND INSTRUMENTS PTE LTD
2 patentsUS10504761B2Dec 10, 2019
Method system for generating 3D composite images of objects and determining object properties based thereon
SEMICONDUCTOR TECH AND INSTRUMENTS PTE LTD2 citations69
US9816938B2Nov 14, 2017
Apparatus and method for selectively inspecting component sidewalls
SEMICONDUCTOR TECH AND INSTRUMENTS PTE LTD6 citations69