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Inventor
KUAI SHUGUANG
CN
2 patents
Patents
2 patents
US10036712B2
Jul 31, 2018
Defect inspection system and method using an array of light sources
PHILIPS LIGHTING HOLDING BV
8 citations
76
US9929875B2
Mar 27, 2018
Detection system and method and space control system using such a detection system
PHILIPS LIGHTING HOLDING BV
0 citations
34