Inventor
GOTO YOSHIRO
JP19 patents
⚠️ This page may combine multiple inventors who share the name “GOTO YOSHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
10 patentsUS5719430AFeb 17, 1998
Buried-channel MOS transistor and process of producing same
NEC CORP45 citations96
US6503800B2Jan 7, 2003
Manufacturing method of semiconductor device having different gate oxide thickness
NEC CORP24 citations92
US5614432AMar 25, 1997
Method for manufacturing LDD type MIS device
NEC CORP41 citations92
US5306936AApr 26, 1994
Non-volatile semiconductor memory device having oxynitride film for preventing charge in floating gate from loss
NEC CORP21 citations92
US6664148B2Dec 16, 2003
Integrated circuit device with switching between active mode and standby mode controlled by digital circuit
NEC CORP7 citations73
US6388504B1May 14, 2002
Integrated circuit device with switching between active mode and standby mode controlled by digital circuit
NEC CORP12 citations73
US6184094B1Feb 6, 2001
Method for producing semiconductor device
NEC CORP14 citations73
US5933737AAug 3, 1999
Buried-channel MOS transistor and process of producing same
NEC CORP14 citations73
US5733818AMar 31, 1998
Method for fabricating semiconductor device with planarization step using CMP
NEC CORP6 citations73
US6521500B1Feb 18, 2003
Semiconductor device and method of manufacturing the same
NEC CORP2 citations62
FUJITSU LTD
8 patentsUS5999005ADec 7, 1999
Voltage and displacement measuring apparatus and probe
FUJITSU LTD18 citations92
US5916458AJun 29, 1999
Production of optical module assembly
FUJITSU LTD38 citations92
US5331275AJul 19, 1994
Probing device and system for testing an integrated circuit
FUJITSU LTD43 citations92
US4177379ADec 4, 1979
Back-scattered electron detector for use in an electron microscope or electron beam exposure system to detect back-scattered electrons
FUJITSU LTD22 citations82
US5677635AOct 14, 1997
Voltage and displacement measuring apparatus and probe
FUJITSU LTD10 citations73
US5550479AAug 27, 1996
Signal measuring apparatus and signal measuring method
FUJITSU LTD11 citations72
US4755749AJul 5, 1988
Strobo electron beam apparatus
FUJITSU LTD5 citations60
US4484077ANov 20, 1984
Exposure system and method using an electron beam
FUJITSU LTD1 citations52