Inventor

JÄHNKE TORSTEN

DE4 patents

⚠️ This page may combine multiple inventors who share the name “JÄHNKE TORSTEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BRUKER NANO GMBH

1 patent

US10539591B2Jan 21, 2020

Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscope

BRUKER NANO GMBH0 citations31

MÜLLER TORSTEN

1 patent

US8898809B2Nov 25, 2014

Method and apparatus for the combined analysis of a sample with objects to be analyzed

MÜLLER TORSTEN0 citations30

JPK INSTRUMENTS AG

1 patent

US9080937B2Jul 14, 2015

Apparatus and a method for investigating a sample by means of several investigation methods

JPK INSTRUMENTS AG0 citations28

JÄHNKE TORSTEN

1 patent

US8769711B2Jul 1, 2014

Method for examining a measurement object, and apparatus

JÄHNKE TORSTEN0 citations24