Inventor

UKRAINTSEV VLADIMIR A

US9 patents

⚠️ This page may combine multiple inventors who share the name “UKRAINTSEV VLADIMIR A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

DCG SYSTEMS INC

3 patents

US9057740B1Jun 16, 2015

Probe-based data collection system with adaptive mode of probing

DCG SYSTEMS INC7 citations81

US8895923B2Nov 25, 2014

System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing

DCG SYSTEMS INC7 citations81

US9506947B2Nov 29, 2016

System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing

DCG SYSTEMS INC2 citations60

TEXAS INSTRUMENTS INC

2 patents

US6967349B2Nov 22, 2005

Method for fabricating a multi-level integrated circuit having scatterometry test structures stacked over same footprint area

TEXAS INSTRUMENTS INC6 citations61

US7381950B2Jun 3, 2008

Characterizing dimensions of structures via scanning probe microscopy

TEXAS INSTRUMENTS INC3 citations55

FEI EFA INC

1 patent

US9891280B2Feb 13, 2018

Probe-based data collection system with adaptive mode of probing controlled by local sample properties

FEI EFA INC7 citations81

FEI CO

1 patent

US10175295B2Jan 8, 2019

Optical nanoprobing of integrated circuits

FEI CO4 citations70

UKRAINTSEV VLADIMIR A

1 patent

US8305097B2Nov 6, 2012

Method for calibrating an inspection tool

UKRAINTSEV VLADIMIR A0 citations43

ROGERS DUNCAN M

1 patent

US9347897B2May 24, 2016

Characterizing dimensions of structures via scanning probe microscopy

ROGERS DUNCAN M0 citations38