Inventor
TANIBATA YASUHIRO
JP4 patents
Patents
4 patentsUS7190514B2Mar 13, 2007
Confocal scanning microscope
YOKOGAWA ELECTRIC CORP16 citations80
US5665964ASep 9, 1997
Particle component analyzing apparatus, and equivalent particle diameter measuring method using same
YOKOGAWA ELECTRIC CORP4 citations57
US5510611AApr 23, 1996
Particle component analyzing apparatus, and equivalent particle diameter measuring method using same
YOKOGAWA ELECTRIC CORP2 citations57
US7599113B2Oct 6, 2009
Method for adjusting confocal microscope
YOKOGAWA ELECTRIC CORP2 citations55