Inventor
YAMADA TAKEO
JP90 patents
⚠️ This page may combine multiple inventors who share the name “YAMADA TAKEO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
20 patentsUS5219794AJun 15, 1993
Semiconductor integrated circuit device and method of fabricating same
HITACHI LTD149 citations99
US5067007ANov 19, 1991
Semiconductor device having leads for mounting to a surface of a printed circuit board
HITACHI LTD360 citations98
US5758940AJun 2, 1998
Liquid crystal Projection display
HITACHI LTD59 citations96
US5537171AJul 16, 1996
Liquid crystal projection display
HITACHI LTD73 citations96
US5306948AApr 26, 1994
Semiconductor device and semiconductor module having auxiliary high power supplying terminals
HITACHI LTD63 citations96
US5341049AAug 23, 1994
Integrated circuit having alternate rows of logic cells and I/O cells
HITACHI LTD99 citations94
US5898636AApr 27, 1999
Semiconductor integrated circuit device with interleaved memory and logic blocks
HITACHI LTD27 citations92
US5485560AJan 16, 1996
Displaying method and system for displaying an object by designating a state of display of the object
HITACHI LTD25 citations92
US5355187AOct 11, 1994
Liquid crystal projection display
HITACHI LTD50 citations92
US4961030AOct 2, 1990
Miss convergence compensating device for projection type display
HITACHI LTD29 citations92
US5053724AOct 1, 1991
High precision PLL with circuit for preventing erroneous capture
HITACHI LTD15 citations74
US6034912AMar 7, 2000
Semiconductor integrated circuit device and method of manufacturing the same
HITACHI LTD13 citations73
US5337090AAug 9, 1994
Video output circuit with wide bandwidth and low power consumption for high resolution display
HITACHI LTD9 citations73
US5039923AAug 13, 1991
Focus adjusting device for projection display
HITACHI LTD12 citations73
US4980614ADec 25, 1990
Convergence correction circuit
HITACHI LTD11 citations73
US4814671AMar 21, 1989
Convergence circuit
HITACHI LTD10 citations73
US5649081AJul 15, 1997
Method and apparatus for pattern data processing
HITACHI LTD13 citations72
US5589883ADec 31, 1996
Cathode ray tube display
HITACHI LTD15 citations71
US5432404AJul 11, 1995
Apparatus for detecting a geometric distortion of an image on a display device
HITACHI LTD12 citations71
US5194783AMar 16, 1993
Display apparatus based on a digital convergence scheme
HITACHI LTD16 citations71
NIPPON KOKAN KK
17 patentsUS6227702B1May 8, 2001
Method and apparatus for measuring a temperature of a molten metal
NIPPON KOKAN KK44 citations95
US5335066AAug 2, 1994
Measuring method for ellipsometric parameter and ellipsometer
NIPPON KOKAN KK69 citations95
US5088836AFeb 18, 1992
Apparatus for temperature measurement
NIPPON KOKAN KK81 citations94
US5733043AMar 31, 1998
Temperature measuring device
NIPPON KOKAN KK24 citations92
US5311285AMay 10, 1994
Measuring method for ellipsometric parameter and ellipsometer
NIPPON KOKAN KK46 citations92
US4647854AMar 3, 1987
Apparatus for measuring the level of the molten metal in the mold of a continuous casting machine
NIPPON KOKAN KK45 citations92
US3997835ADec 14, 1976
Method and apparatus for measuring distance
NIPPON KOKAN KK43 citations92
US5438415AAug 1, 1995
Ellipsometer and method of controlling coating thickness therewith
NIPPON KOKAN KK44 citations90
US5213417AMay 25, 1993
Apparatus for temperature measurement
NIPPON KOKAN KK43 citations90
US4095469AJun 20, 1978
Temperature measuring apparatus
NIPPON KOKAN KK34 citations89
US4606641AAug 19, 1986
Apparatus for measuring film thickness
NIPPON KOKAN KK37 citations87
US4030027AJun 14, 1977
Apparatus for non-contact measurement of distance from a metallic body using a detection coil in the feedback circuit of an amplifier
NIPPON KOKAN KK24 citations81
US4186792AFeb 5, 1980
Apparatus for monitoring and controlling the level of the molten metal in the mold of a continuous casting machine
NIPPON KOKAN KK23 citations78
US4567435AJan 28, 1986
Method and apparatus for continuously measuring distance utilizing eddy current and having temperature difference influence elimination
NIPPON KOKAN KK17 citations74
US4019131AApr 19, 1977
Method and apparatus for measuring the shape of the wavy edges of metal strips using a detection coil controlled to track the strip edge
NIPPON KOKAN KK15 citations73
US3995211ANov 30, 1976
Electromagnetic induction type detectors
NIPPON KOKAN KK7 citations73
US4024903AMay 24, 1977
Evaporative cooling method by natural circulation of cooling water
NIPPON KOKAN KK10 citations72
NIRECO CORP
5 patentsUS5934521AAug 10, 1999
Hot melt applicator and nozzle used therefor
NIRECO CORP27 citations89
US5924607AJul 20, 1999
Hot melt applicator and nozzle used therefor
NIRECO CORP23 citations89
US6844930B2Jan 18, 2005
Spectrophotometer
NIRECO CORP13 citations84
US6281499B1Aug 28, 2001
Method for analyzing measured value by on-line spectral analyzer
NIRECO CORP14 citations74
US5641357AJun 24, 1997
Apparatus for checking glue application state
NIRECO CORP10 citations72
KOMATSU MFG CO LTD
3 patentsVITANET JAPAN INC
1 patentYAMADA DOBBY CO LTD
1 patentYAMADA TAKEO
1 patentMITSUI CHEMICALS INC
1 patentISHIHARA MINING & CHEMICAL CO
1 patentShowing the top 50 of 90 patents by PatentIndex Score.