P

Inventor

USAMI TATSUYA

JP120 patents
⚠️ This page may combine multiple inventors who share the name “USAMI TATSUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NEC CORP

27 patents
US6514852B2Feb 4, 2003

Semiconductor device and method of manufacturing the same

NEC CORP48 citations96
US6255732B1Jul 3, 2001

Semiconductor device and process for producing the same

NEC CORP46 citations96
US6225217B1May 1, 2001

Method of manufacturing semiconductor device having multilayer wiring

NEC CORP52 citations96
US6222269B1Apr 24, 2001

Semiconductor device and fabrication process thereof

NEC CORP42 citations96
US6077574AJun 20, 2000

Plasma CVD process for forming a fluorine-doped SiO2 dielectric film

NEC CORP45 citations96
US6787480B2Sep 7, 2004

Manufacturing method of semicondcutor device

NEC CORP49 citations95
US6531755B1Mar 11, 2003

Semiconductor device and manufacturing method thereof for realizing high packaging density

NEC CORP22 citations93
US6468898B1Oct 22, 2002

Method of manufacturing semiconductor device

NEC CORP36 citations93
US6187662B1Feb 13, 2001

Semiconductor device with low permittivity interlayer insulating film and method of manufacturing the same

NEC CORP25 citations93
US6133137AOct 17, 2000

Semiconductor device and method of manufacturing the same

NEC CORP23 citations93
US6099747AAug 8, 2000

Chamber etching of plasma processing apparatus

NEC CORP35 citations93
US5863339AJan 26, 1999

Chamber etching of plasma processing apparatus

NEC CORP44 citations93
US7701060B2Apr 20, 2010

Wiring structure and method for manufacturing the same

NEC CORP20 citations92
US6157083ADec 5, 2000

Fluorine doping concentrations in a multi-structure semiconductor device

NEC CORP21 citations92
US6005291ADec 21, 1999

Semiconductor device and process for production thereof

NEC CORP42 citations92
US5751050AMay 12, 1998

Semiconductor device having a polysilicon resistor element with increased stability and method of fabricating same

NEC CORP48 citations92
US6124213ASep 26, 2000

Process of fabricating semiconductor device having ashing step for photo-resist mask in plasma produced from Nx Hy gas

NEC CORP27 citations91
US6479407B2Nov 12, 2002

Semiconductor device and process for producing the same

NEC CORP14 citations84
US6319797B1Nov 20, 2001

Process for manufacturing a semiconductor device

NEC CORP15 citations84
US6528410B1Mar 4, 2003

Method for manufacturing semiconductor device

NEC CORP8 citations74
US6483193B2Nov 19, 2002

Fabrication process for a semiconductor device with damascene interconnect lines of the same level separated by insulators with different dielectric constants

NEC CORP9 citations74
US6383927B2May 7, 2002

Process for fabricating semiconductor device, apparatus using more than one kind of inert gas for evacuating air and method for entering wafer into the apparatus

NEC CORP8 citations74
US6340843B1Jan 22, 2002

Plasma CVD dielectric film and process for forming the same

NEC CORP5 citations74
US6294833B1Sep 25, 2001

Semiconductor device and fabrication process thereof

NEC CORP9 citations74
US6194775B1Feb 27, 2001

Semiconductor element with thermally nitrided film on high resistance film and method of manufacturing the same

NEC CORP11 citations74
US6140225AOct 31, 2000

Method of manufacturing semiconductor device having multilayer wiring

NEC CORP15 citations74
US5939771AAug 17, 1999

Semiconductor device having an organic resin layer and silicon oxide layer containing fluorine for preventing crosstalk between metal lines and a method of manufacturing the same

NEC CORP16 citations74

NEC ELECTRONICS CORP

20 patents
US6589863B1Jul 8, 2003

Semiconductor device and manufacturing method thereof

NEC ELECTRONICS CORP45 citations96
US7674721B2Mar 9, 2010

Semiconductor device, semiconductor wafer, and methods of producing same device and wafer

NEC ELECTRONICS CORP17 citations93
US7291911B2Nov 6, 2007

Semiconductor device and manufacturing method thereof

NEC ELECTRONICS CORP16 citations93
US7531891B2May 12, 2009

Semiconductor device

NEC ELECTRONICS CORP22 citations92
US7391115B2Jun 24, 2008

Semiconductor device and manufacturing method thereof

NEC ELECTRONICS CORP23 citations92
US7132732B2Nov 7, 2006

Semiconductor device having two distinct sioch layers

NEC ELECTRONICS CORP16 citations92
US7763979B2Jul 27, 2010

Organic insulating film, manufacturing method thereof, semiconductor device using such organic insulating film and manufacturing method thereof

NEC ELECTRONICS CORP12 citations84
US7615498B2Nov 10, 2009

Method of manufacturing a semiconductor device

NEC ELECTRONICS CORP10 citations84
US7612453B2Nov 3, 2009

Semiconductor device having an interconnect structure and a reinforcing insulating film

NEC ELECTRONICS CORP11 citations84
US7180191B2Feb 20, 2007

Semiconductor device and method of manufacturing a semiconductor device

NEC ELECTRONICS CORP14 citations84
US7057286B2Jun 6, 2006

Semiconductor device and method of manufacturing the same

NEC ELECTRONICS CORP11 citations84
US6930036B2Aug 16, 2005

Semiconductor device and method of manufacturing the same

NEC ELECTRONICS CORP12 citations84
US7563705B2Jul 21, 2009

Manufacturing method of semiconductor device

NEC ELECTRONICS CORP10 citations83
US7268087B2Sep 11, 2007

Manufacturing method of semiconductor device

NEC ELECTRONICS CORP10 citations83
US7217654B2May 15, 2007

Semiconductor device and method of manufacturing the same

NEC ELECTRONICS CORP18 citations83
US7420279B2Sep 2, 2008

Carbon containing silicon oxide film having high ashing tolerance and adhesion

NEC ELECTRONICS CORP13 citations81
US7473630B2Jan 6, 2009

Semiconductor device and method for manufacturing same

NEC ELECTRONICS CORP7 citations74
US7229910B2Jun 12, 2007

Method of producing a semiconductor device having a multi-layered insulation film

NEC ELECTRONICS CORP7 citations74
US6984875B2Jan 10, 2006

Semiconductor device with improved reliability and manufacturing method of the same

NEC ELECTRONICS CORP10 citations74
US6670709B2Dec 30, 2003

Semiconductor device and method of manufacturing the same

NEC ELECTRONICS CORP8 citations74

RENESAS ELECTRONICS CORP

2 patents

USAMI TATSUYA

1 patent

Showing the top 50 of 120 patents by PatentIndex Score.