Inventor
AHMAD AFTAB
US76 patents
⚠️ This page may combine multiple inventors who share the name “AHMAD AFTAB”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
39 patentsUS5483175AJan 9, 1996
Method for circuits connection for wafer level burning and testing of individual dies on semiconductor wafer
MICRON TECHNOLOGY INC156 citations99
US5457400AOct 10, 1995
Semiconductor array having built-in test circuit for wafer level testing
MICRON TECHNOLOGY INC194 citations99
US5241266AAug 31, 1993
Built-in test circuit connection for wafer level burnin and testing of individual dies
MICRON TECHNOLOGY INC176 citations99
US5489546AFeb 6, 1996
Method of forming CMOS devices using independent thickness spacers in a split-polysilicon DRAM process
MICRON TECHNOLOGY INC114 citations98
US6373114B1Apr 16, 2002
Barrier in gate stack for improved gate dielectric integrity
MICRON TECHNOLOGY INC76 citations96
US6037639AMar 14, 2000
Fabrication of integrated devices using nitrogen implantation
MICRON TECHNOLOGY INC64 citations96
US5719424AFeb 17, 1998
Graded LDD implant process for sub-half-micron MOS devices
MICRON TECHNOLOGY INC59 citations96
US5716862AFeb 10, 1998
High performance PMOSFET using split-polysilicon CMOS process incorporating advanced stacked capacitior cells for fabricating multi-megabit DRAMS
MICRON TECHNOLOGY INC55 citations96
US5702976ADec 30, 1997
Shallow trench isolation using low dielectric constant insulator
MICRON TECHNOLOGY INC88 citations96
US7071067B1Jul 4, 2006
Fabrication of integrated devices using nitrogen implantation
MICRON TECHNOLOGY INC17 citations93
US6930363B2Aug 16, 2005
Barrier in gate stack for improved gate dielectric integrity
MICRON TECHNOLOGY INC16 citations93
US6770571B2Aug 3, 2004
Barrier in gate stack for improved gate dielectric integrity
MICRON TECHNOLOGY INC15 citations93
US6552394B2Apr 22, 2003
Semiconductor transistor devices and structures with halo regions
MICRON TECHNOLOGY INC15 citations93
US6495885B1Dec 17, 2002
Graded LDD implant process for sub-half-micron MOS devices
MICRON TECHNOLOGY INC17 citations93
US6165827ADec 26, 2000
Semiconductor transistor devices and methods for forming semiconductor transistor devices
MICRON TECHNOLOGY INC20 citations93
US6107145AAug 22, 2000
Method for forming a field effect transistor
MICRON TECHNOLOGY INC19 citations93
US6046472AApr 4, 2000
Graded LDD implant process for sub-half-micron MOS devices
MICRON TECHNOLOGY INC19 citations93
US5849615ADec 15, 1998
Semiconductor processing method of fabricating field effect transistors
MICRON TECHNOLOGY INC24 citations93
US5811329ASep 22, 1998
Method of forming CMOS circuitry including patterning a layer of conductive material overlying field isolation oxide
MICRON TECHNOLOGY INC20 citations93
US5733809AMar 31, 1998
Split-polysilicon CMOS process for multi-megabit dynamic memories incorporating stacked container capacitor cells
MICRON TECHNOLOGY INC23 citations93
US5208176AMay 4, 1993
Method of fabricating an enhanced dynamic random access memory (DRAM) cell capacitor using multiple polysilicon texturization
MICRON TECHNOLOGY INC40 citations93
US6211026B1Apr 3, 2001
Methods of forming integrated circuitry, methods of forming elevated source/drain regions of a field effect transistor, and methods of forming field effect transistors
MICRON TECHNOLOGY INC27 citations92
US6660600B2Dec 9, 2003
Methods of forming integrated circuitry, methods of forming elevated source/drain regions of a field effect transistor, and methods of forming field effect transistors
MICRON TECHNOLOGY INC13 citations83
US6346439B1Feb 12, 2002
Semiconductor transistor devices and methods for forming semiconductor transistor devices
MICRON TECHNOLOGY INC12 citations82
US6159813ADec 12, 2000
Graded LDD implant process for sub-half-micron MOS devices
MICRON TECHNOLOGY INC13 citations82
US5923977AJul 13, 1999
Method of forming CMOS circuitry including patterning a layer of conductive material overlying field isolation oxide
MICRON TECHNOLOGY INC16 citations82
US5830798ANov 3, 1998
Method for forming a field effect transistor
MICRON TECHNOLOGY INC15 citations82
US5668037ASep 16, 1997
Method of forming a resistor and integrated circuitry having a resistor construction
MICRON TECHNOLOGY INC14 citations82
US7176549B2Feb 13, 2007
Shallow trench isolation using low dielectric constant insulator
MICRON TECHNOLOGY INC8 citations74
US6858507B2Feb 22, 2005
Graded LDD implant process for sub-half-micron MOS devices
MICRON TECHNOLOGY INC3 citations74
US6664600B2Dec 16, 2003
Graded LDD implant process for sub-half-micron MOS devices
MICRON TECHNOLOGY INC5 citations74
US6448141B1Sep 10, 2002
Graded LDD implant process for sub-half-micron MOS devices
MICRON TECHNOLOGY INC6 citations74
US6333539B1Dec 25, 2001
Semiconductor transistor devices and methods for forming semiconductor transistor devices
MICRON TECHNOLOGY INC7 citations74
US6319779B1Nov 20, 2001
Semiconductor transistor devices and methods for forming semiconductor transistor devices
MICRON TECHNOLOGY INC10 citations74
US6150204ANov 21, 2000
Semiconductor processing method of fabricating field effect transistors
MICRON TECHNOLOGY INC9 citations74
US6136637AOct 24, 2000
Method of forming CMOS circuitry including patterning conductive material overlying field isolation oxide
MICRON TECHNOLOGY INC5 citations74
US6090685AJul 18, 2000
Method of forming a LOCOS trench isolation structure
MICRON TECHNOLOGY INC9 citations74
US5821150AOct 13, 1998
Method of forming a resistor and integrated circuitry having a resistor construction
MICRON TECHNOLOGY INC6 citations74
US5780920AJul 14, 1998
Method of forming a resistor and integrated circuitry having a resistor construction
MICRON TECHNOLOGY INC5 citations74
MICRON SEMICONDUCTOR INC
4 patentsUS5405791AApr 11, 1995
Process for fabricating ULSI CMOS circuits using a single polysilicon gate layer and disposable spacers
MICRON SEMICONDUCTOR INC188 citations99
US5338700AAug 16, 1994
Method of forming a bit line over capacitor array of memory cells
MICRON SEMICONDUCTOR INC311 citations99
US5494841AFeb 27, 1996
Split-polysilicon CMOS process for multi-megabit dynamic memories incorporating stacked container capacitor cells
MICRON SEMICONDUCTOR INC111 citations98
US5382533AJan 17, 1995
Method of manufacturing small geometry MOS field-effect transistors having improved barrier layer to hot electron injection
MICRON SEMICONDUCTOR INC143 citations98
UNIV KING FAHD PET & MINERALS
4 patentsUS11112294B2Sep 7, 2021
System for multiphase (oil-gas-water) flow meter calibration
UNIV KING FAHD PET & MINERALS8 citations84
US9964533B2May 8, 2018
System for measuring multi-phase fluid flow characteristics
UNIV KING FAHD PET & MINERALS11 citations84
US10544587B2Jan 28, 2020
Composite wall panel
UNIV KING FAHD PET & MINERALS8 citations83
US9134160B2Sep 15, 2015
Online multi-phase flow meter system
UNIV KING FAHD PET & MINERALS9 citations82
NEUROWAVE MEDICAL TECHNOLOGIES LLC
1 patentLSI LOGIC CORP
1 patentAL-HADHRAMI LUAI M
1 patentShowing the top 50 of 76 patents by PatentIndex Score.