Inventor

CHACON CARLOS M

US7 patents

⚠️ This page may combine multiple inventors who share the name “CHACON CARLOS M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LUCENT TECHNOLOGIES INC

3 patents

US6265890B1Jul 24, 2001

In-line non-contact depletion capacitance measurement method and apparatus

LUCENT TECHNOLOGIES INC44 citations92

US6255128B1Jul 3, 2001

Non-contact method for determining the presence of a contaminant in a semiconductor device

LUCENT TECHNOLOGIES INC39 citations92

US6207468B1Mar 27, 2001

Non-contact method for monitoring and controlling plasma charging damage in a semiconductor device

LUCENT TECHNOLOGIES INC19 citations92

AGERE SYSTEMS INC

2 patents

US6664800B2Dec 16, 2003

Non-contact method for determining quality of semiconductor dielectrics

AGERE SYSTEMS INC28 citations92

US6548422B1Apr 15, 2003

Method and structure for oxide/silicon nitride interface substructure improvements

AGERE SYSTEMS INC11 citations73

AGERE SYST GUARDIAN CORP

2 patents

US6391668B1May 21, 2002

Method of determining a trap density of a semiconductor/oxide interface by a contactless charge technique

AGERE SYST GUARDIAN CORP27 citations87

US6251697B1Jun 26, 2001

Non-contact method for monitoring and controlling plasma charging damage in a semiconductor device

AGERE SYST GUARDIAN CORP7 citations73