Inventor · disambiguated record
Victor Havin
Also filed as: HAVIN VICTOR · HAVIN VICTOR L · HAVIN VICTOR LEON
10 granted patents·2 pending applications·51 citations·filing 2004–2022
84Inventor score
Top patents by PatentIndex Score
12 records- 0187US9575740B2Apparatus and method for running multiple instances of a same application in mobile devicesSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Feb 21, 2017·7 cites·20 claims
- 0287US7765537B2Profiling interface assisted class loading for byte code instrumented logicIBM·Filed 2005·Granted Jul 27, 2010·25 cites·13 claims
- 0378US8539454B2Method and system for detecting memory leaksHAVIN VICTOR L·Filed 2009·Granted Sep 17, 2013·14 cites·17 claims
- 0458USRE48311EApparatus and method for running multiple instances of a same application in mobile devicesSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Nov 17, 2020·0 cites·45 claims
- 0553US7519944B2Computer method and system for executing post-processing logic depending on function exit typeIBM·Filed 2004·Granted Apr 14, 2009·5 cites·18 claims
- 0644US2009172368A1Hardware Based Runtime Error DetectionIBM·Filed 2007·Application pending·0 cites
- 0742US12289174B1System and method for supporting an integrated speaker portal in an event data management systemVEEVA SYSTEMS INC·Filed 2022·Granted Apr 29, 2025·0 cites·19 claims
- 0842US10430091B2Electronic device and method for storing security information thereofSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Oct 1, 2019·0 cites·20 claims
- 0942US2008109794A1Method for Signaling Runtime Events to an Automated Test ScriptIBM·Filed 2006·Application pending·0 cites
- 1041US7769976B2Identifying code that wastes virtual memoryIBM·Filed 2006·Granted Aug 3, 2010·0 cites·17 claims
- 1134US9495278B2Dynamic discovery of data segments within instrumented codeHAVIN VICTOR·Filed 2006·Granted Nov 15, 2016·0 cites·11 claims
- 1231US8141055B2Method for dynamic discovery of code segments in instrumented binary modulesCHERKASOV SERGEY·Filed 2007·Granted Mar 20, 2012·0 cites·3 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →