P

Inventor

HASHIMOTO YOSHIHIRO

JP79 patents
⚠️ This page may combine multiple inventors who share the name “HASHIMOTO YOSHIHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANTEST CORP

24 patents
US6975978B1Dec 13, 2005

Method and apparatus for fault simulation of semiconductor integrated circuit

ADVANTEST CORP64 citations96
US7132844B2Nov 7, 2006

Testing device and testing method for testing an electronic device

ADVANTEST CORP28 citations93
US7005867B2Feb 28, 2006

Power supply circuit and testing device

ADVANTEST CORP20 citations93
US6828815B2Dec 7, 2004

Method and apparatus for defect analysis of semiconductor integrated circuit

ADVANTEST CORP17 citations93
US6593765B1Jul 15, 2003

Testing apparatus and testing method for semiconductor integrated circuit

ADVANTEST CORP26 citations93
US6404220B1Jun 11, 2002

IC testing method and IC testing device using the same

ADVANTEST CORP33 citations93
US6391667B1May 21, 2002

Power supply unit, semiconductor device testing apparatus and semiconductor device testing method

ADVANTEST CORP22 citations93
US6323668B1Nov 27, 2001

IC testing device

ADVANTEST CORP26 citations93
US6313657B1Nov 6, 2001

IC testing apparatus and testing method using same

ADVANTEST CORP51 citations93
US6255842B1Jul 3, 2001

Applied-voltage-based current measuring method and device

ADVANTEST CORP41 citations93
US6255839B1Jul 3, 2001

Voltage applied type current measuring circuit in an IC testing apparatus

ADVANTEST CORP29 citations93
US5594359AJan 14, 1997

Voltage generating circuit for IC test

ADVANTEST CORP24 citations93
US7825666B2Nov 2, 2010

Test apparatus and measurement apparatus for measuring an electric current consumed by a device under test

ADVANTEST CORP8 citations84
US7576555B2Aug 18, 2009

Current measuring apparatus, test apparatus, current measuring method and test method

ADVANTEST CORP15 citations84
US7330024B2Feb 12, 2008

Power supply device, test apparatus, and power supply voltage stabilizing device

ADVANTEST CORP9 citations84
US7138819B2Nov 21, 2006

Differential voltage measuring apparatus and semiconductor testing apparatus

ADVANTEST CORP16 citations84
US6801049B2Oct 5, 2004

Method and apparatus for defect analysis of semiconductor integrated circuit

ADVANTEST CORP14 citations84
US6492831B2Dec 10, 2002

Current measuring method and current measuring apparatus

ADVANTEST CORP9 citations74
US5874827AFeb 23, 1999

Voltage supply circuit for a load absorbing high tentative peak current

ADVANTEST CORP10 citations74
US4985672AJan 15, 1991

Test equipment for a low current IC

ADVANTEST CORP13 citations70
US7804293B2Sep 28, 2010

Power supply and stabilizer

ADVANTEST CORP2 citations63
US7362104B2Apr 22, 2008

Current measurement device and test device

ADVANTEST CORP3 citations63
US6781364B2Aug 24, 2004

Electron device testing apparatus having high current and low current testing features

ADVANTEST CORP6 citations63
US6756774B2Jun 29, 2004

Constant voltage source, a constant voltage source circuit board and a method for applying a constant voltage

ADVANTEST CORP2 citations63

SUMITOMO OSAKA CEMENT CO LTD

5 patents

SONY CORP

3 patents

SUMITOMO ELECTRIC INDUSTRIES

3 patents

NITTO CHEMICAL INDUSTRY CO LTD

3 patents

SHIMADZU CORP

2 patents

FUJITSU FANUC LTD

2 patents

SHARP KK

2 patents

ASAHI GLASS CO LTD

1 patent

HASHIMOTO YOSHIHIRO

1 patent

NITTO CHEMICAL CO LTD

1 patent

TOKYO ELECTRON LTD

1 patent

FUJITSU LTD

1 patent

NAT INST INF & COMM TECH

1 patent

Showing the top 50 of 79 patents by PatentIndex Score.