P

Inventor

FISHBURN FRED

US35 patents
⚠️ This page may combine multiple inventors who share the name “FISHBURN FRED”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

28 patents
US6787833B1Sep 7, 2004

Integrated circuit having a barrier structure

MICRON TECHNOLOGY INC40 citations96
US6707088B2Mar 16, 2004

Method of forming integrated circuitry, method of forming a capacitor, method of forming DRAM integrated circuitry and DRAM integrated category

MICRON TECHNOLOGY INC49 citations96
US6372574B1Apr 16, 2002

Method of forming a capacitor container electrode and method of patterning a metal layer by selectively silicizing the electrode or metal layer and removing the silicized portion

MICRON TECHNOLOGY INC65 citations96
US7321150B2Jan 22, 2008

Semiconductor device precursor structures to a double-sided capacitor or a contact

MICRON TECHNOLOGY INC39 citations95
US7268039B2Sep 11, 2007

Method of forming a contact using a sacrificial structure

MICRON TECHNOLOGY INC40 citations95
US6613671B1Sep 2, 2003

Conductive connection forming methods, oxidation reducing methods, and integrated circuits formed thereby

MICRON TECHNOLOGY INC19 citations93
US7759193B2Jul 20, 2010

Methods of forming a plurality of capacitors

MICRON TECHNOLOGY INC25 citations92
US7273779B2Sep 25, 2007

Method of forming a double-sided capacitor

MICRON TECHNOLOGY INC31 citations92
US7084004B2Aug 1, 2006

MEMS heat pumps for integrated circuit heat dissipation

MICRON TECHNOLOGY INC23 citations92
US7071055B2Jul 4, 2006

Method of forming a contact structure including a vertical barrier structure and two barrier layers

MICRON TECHNOLOGY INC32 citations92
US6962846B2Nov 8, 2005

Methods of forming a double-sided capacitor or a contact using a sacrificial structure

MICRON TECHNOLOGY INC34 citations92
US6629425B2Oct 7, 2003

MEMS heat pumps for integrated circuit heat dissipation

MICRON TECHNOLOGY INC32 citations92
US6492267B1Dec 10, 2002

Low temperature nitride used as Cu barrier layer

MICRON TECHNOLOGY INC19 citations92
US6475855B1Nov 5, 2002

Method of forming integrated circuitry, method of forming a capacitor and method of forming DRAM integrated circuitry

MICRON TECHNOLOGY INC39 citations92
US7473644B2Jan 6, 2009

Method for forming controlled geometry hardmasks including subresolution elements

MICRON TECHNOLOGY INC15 citations84
US7329607B2Feb 12, 2008

Conductive connection forming methods, oxidation reducing methods, and integrated circuits formed thereby

MICRON TECHNOLOGY INC10 citations84
US7271086B2Sep 18, 2007

Microfeature workpieces and methods of forming a redistribution layer on microfeature workpieces

MICRON TECHNOLOGY INC18 citations82
US7569453B2Aug 4, 2009

Contact structure

MICRON TECHNOLOGY INC5 citations74
US7220663B2May 22, 2007

Conductive connection forming methods, oxidation reducing methods, and integrated circuits formed thereby

MICRON TECHNOLOGY INC4 citations74
US7157324B2Jan 2, 2007

Transistor structure having reduced transistor leakage attributes

MICRON TECHNOLOGY INC6 citations74
US6756678B2Jun 29, 2004

Conductive connection forming methods, oxidation reducing methods, and integrated circuits formed thereby

MICRON TECHNOLOGY INC7 citations74
US7186642B2Mar 6, 2007

Low temperature nitride used as Cu barrier layer

MICRON TECHNOLOGY INC5 citations73
US8687426B2Apr 1, 2014

Multi-semiconductor material vertical memory strings, strings of memory cells having individually biasable channel regions, memory arrays incorporating such strings, and methods of accesssing and forming the same

MICRON TECHNOLOGY INC3 citations63
US7176576B2Feb 13, 2007

Conductive connection forming methods, oxidation reducing methods, and integrated circuits formed thereby

MICRON TECHNOLOGY INC3 citations63
US7105899B2Sep 12, 2006

Transistor structure having reduced transistor leakage attributes

MICRON TECHNOLOGY INC2 citations63
US6984893B2Jan 10, 2006

Low temperature nitride used as Cu barrier layer

MICRON TECHNOLOGY INC2 citations62
US8026542B2Sep 27, 2011

Low resistance peripheral local interconnect contacts with selective wet strip of titanium

MICRON TECHNOLOGY INC1 citations61
US7605033B2Oct 20, 2009

Low resistance peripheral local interconnect contacts with selective wet strip of titanium

MICRON TECHNOLOGY INC4 citations61

APPLIED MATERIALS INC

4 patents

MICRO TECHNOLOGY INC

1 patent

MCDANIEL TERRENCE

1 patent

FISHBURN FRED

1 patent