Inventor
VAJANA BRUNO
IT42 patents
⚠️ This page may combine multiple inventors who share the name “VAJANA BRUNO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ST MICROELECTRONICS SRL
30 patentsUS6624015B2Sep 23, 2003
Method for manufacturing electronic devices having non-volatile memory cells and LV transistors with salicided junctions
ST MICROELECTRONICS SRL17 citations92
US6528885B2Mar 4, 2003
Anti-deciphering contacts
ST MICROELECTRONICS SRL24 citations92
US6350652B1Feb 26, 2002
Process for manufacturing nonvolatile memory cells with dimensional control of the floating gate regions
ST MICROELECTRONICS SRL55 citations92
US6351008B1Feb 26, 2002
Method for manufacturing electronic devices having non-volatile memory cells and LV transistors with salicided junctions
ST MICROELECTRONICS SRL17 citations92
US6281077B1Aug 28, 2001
Method for manufacturing electronic devices comprising non-volatile memory cells and LV transistors with salicided junctions
ST MICROELECTRONICS SRL27 citations92
US6268247B1Jul 31, 2001
Memory cell of the EEPROM type having its threshold set by implantation, and fabrication method
ST MICROELECTRONICS SRL26 citations92
US6251728B1Jun 26, 2001
Method for manufacturing electronic devices having HV transistors and LV transistors with salicided junctions
ST MICROELECTRONICS SRL17 citations92
US6221717B1Apr 24, 2001
EEPROM memory cell comprising a selection transistor with threshold voltage adjusted by implantation, and related manufacturing process
ST MICROELECTRONICS SRL31 citations92
US6573130B1Jun 3, 2003
Process for manufacturing electronic devices having non-salicidated non-volatile memory cells, non-salicidated HV transistors, and salicidated-junction LV transistors
ST MICROELECTRONICS SRL17 citations84
US6548857B2Apr 15, 2003
Low resistance contact structure for a select transistor of EEPROM memory cells in a NO-DPCC process
ST MICROELECTRONICS SRL13 citations84
US6614080B2Sep 2, 2003
Mask programmed ROM inviolable by reverse engineering inspections and method of fabrication
ST MICROELECTRONICS SRL11 citations74
US6501147B1Dec 31, 2002
Process for manufacturing electronic devices comprising high voltage MOS transistors, and electronic device thus obtained
ST MICROELECTRONICS SRL8 citations74
US6576517B1Jun 10, 2003
Method for obtaining a multi-level ROM in an EEPROM process flow
ST MICROELECTRONICS SRL8 citations73
US6521957B2Feb 18, 2003
Method for forming a multilevel ROM memory in a dual gate CMOS process, and corresponding ROM memory cell
ST MICROELECTRONICS SRL10 citations73
US6479347B1Nov 12, 2002
Simplified DSCP process for manufacturing FLOTOX EEPROM non-autoaligned semiconductor memory cells
ST MICROELECTRONICS SRL12 citations73
US6420769B2Jul 16, 2002
Method for manufacturing electronic devices having HV transistors and LV transistors with salicided junctions
ST MICROELECTRONICS SRL13 citations73
US6380034B1Apr 30, 2002
Process for manufacturing memory cells with dimensional control of the floating gate regions
ST MICROELECTRONICS SRL8 citations73
US6274411B1Aug 14, 2001
Method for manufacturing electronic devices, comprising non-salicided non-volatile memory cells, non-salicided HV transistors, and LV transistors with salicided junctions with few masks
ST MICROELECTRONICS SRL14 citations73
US6194270B1Feb 27, 2001
Process for the manufacturing of an electrically programmable non-volatile memory device
ST MICROELECTRONICS SRL12 citations73
US6414349B1Jul 2, 2002
High efficiency memory device
ST MICROELECTRONICS SRL2 citations62
US6396101B2May 28, 2002
Method for manufacturing electronic devices comprising non-volatile memory cells and LV transistors with salicided junctions
ST MICROELECTRONICS SRL2 citations62
US6340828B1Jan 22, 2002
Process for manufacturing nonvolatile memory cells with dimensional control of the floating gate regions
ST MICROELECTRONICS SRL2 citations62
US6329254B1Dec 11, 2001
Memory cell of the EEPROM type having its threshold adjusted by implantation, and fabrication method
ST MICROELECTRONICS SRL6 citations62
US6307229B2Oct 23, 2001
Nonvolatile semiconductor memory device structure with superimposed bit lines and short-circuit metal strips
ST MICROELECTRONICS SRL4 citations62
US6300181B1Oct 9, 2001
Process for manufacturing an electronic device including MOS transistors with salicided junctions and non-salicided resistors
ST MICROELECTRONICS SRL5 citations62
US6284607B1Sep 4, 2001
Method of making high-voltage HV transistors with drain extension in a CMOS process of the dual gate type with silicide
ST MICROELECTRONICS SRL3 citations62
US6177313B1Jan 23, 2001
Method for forming a muti-level ROM memory in a dual gate CMOS process, and corresponding ROM memory cell
ST MICROELECTRONICS SRL4 citations62
US6548354B2Apr 15, 2003
Process for producing a semiconductor memory device comprising mass-storage memory cells and shielded memory cells for storing reserved information
ST MICROELECTRONICS SRL1 citations51
US6437395B2Aug 20, 2002
Process for the manufacturing of an electrically programmable non-volatile memory device
ST MICROELECTRONICS SRL1 citations51
US6444526B1Sep 3, 2002
Simplified process for defining the tunnel area in non-aligned, non-volatile semiconductor memory cells
ST MICROELECTRONICS SRL0 citations41
SGS THOMSON MICROELECTRONICS
10 patentsUS5793085AAug 11, 1998
Bipolar transistor compatible with CMOS processes
SGS THOMSON MICROELECTRONICS43 citations90
US6432762B1Aug 13, 2002
Memory cell for EEPROM devices, and corresponding fabricating process
SGS THOMSON MICROELECTRONICS9 citations73
US5985718ANov 16, 1999
Process for fabricating memory cells with two levels of polysilicon for devices of EEPROM type
SGS THOMSON MICROELECTRONICS12 citations73
US5322803AJun 21, 1994
Process for the manufacture of a component to limit the programming voltage and to stabilize the voltage incorporated in an electric device with EEPROM memory cells
SGS THOMSON MICROELECTRONICS13 citations73
US5486487AJan 23, 1996
Method for adjusting the threshold of a read-only memory to achieve low capacitance and high breakdown voltage
SGS THOMSON MICROELECTRONICS12 citations71
US5850360ADec 15, 1998
High-voltage N-channel MOS transistor and associated manufacturing process
SGS THOMSON MICROELECTRONICS3 citations63
US6320219B1Nov 20, 2001
Memory cell for EEPROM devices and corresponding fabricating process
SGS THOMSON MICROELECTRONICS2 citations62
US6097057AAug 1, 2000
Memory cell for EEPROM devices, and corresponding fabricating process
SGS THOMSON MICROELECTRONICS2 citations62
US6144588ANov 7, 2000
Monolithically integrated generator of a plurality of voltage values
SGS THOMSON MICROELECTRONICS4 citations61
US6080626AJun 27, 2000
Memory cell for EEPROM devices, and corresponding fabricating process
SGS THOMSON MICROELECTRONICS1 citations51