P

Inventor

VAJANA BRUNO

IT42 patents
⚠️ This page may combine multiple inventors who share the name “VAJANA BRUNO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ST MICROELECTRONICS SRL

30 patents
US6624015B2Sep 23, 2003

Method for manufacturing electronic devices having non-volatile memory cells and LV transistors with salicided junctions

ST MICROELECTRONICS SRL17 citations92
US6528885B2Mar 4, 2003

Anti-deciphering contacts

ST MICROELECTRONICS SRL24 citations92
US6350652B1Feb 26, 2002

Process for manufacturing nonvolatile memory cells with dimensional control of the floating gate regions

ST MICROELECTRONICS SRL55 citations92
US6351008B1Feb 26, 2002

Method for manufacturing electronic devices having non-volatile memory cells and LV transistors with salicided junctions

ST MICROELECTRONICS SRL17 citations92
US6281077B1Aug 28, 2001

Method for manufacturing electronic devices comprising non-volatile memory cells and LV transistors with salicided junctions

ST MICROELECTRONICS SRL27 citations92
US6268247B1Jul 31, 2001

Memory cell of the EEPROM type having its threshold set by implantation, and fabrication method

ST MICROELECTRONICS SRL26 citations92
US6251728B1Jun 26, 2001

Method for manufacturing electronic devices having HV transistors and LV transistors with salicided junctions

ST MICROELECTRONICS SRL17 citations92
US6221717B1Apr 24, 2001

EEPROM memory cell comprising a selection transistor with threshold voltage adjusted by implantation, and related manufacturing process

ST MICROELECTRONICS SRL31 citations92
US6573130B1Jun 3, 2003

Process for manufacturing electronic devices having non-salicidated non-volatile memory cells, non-salicidated HV transistors, and salicidated-junction LV transistors

ST MICROELECTRONICS SRL17 citations84
US6548857B2Apr 15, 2003

Low resistance contact structure for a select transistor of EEPROM memory cells in a NO-DPCC process

ST MICROELECTRONICS SRL13 citations84
US6614080B2Sep 2, 2003

Mask programmed ROM inviolable by reverse engineering inspections and method of fabrication

ST MICROELECTRONICS SRL11 citations74
US6501147B1Dec 31, 2002

Process for manufacturing electronic devices comprising high voltage MOS transistors, and electronic device thus obtained

ST MICROELECTRONICS SRL8 citations74
US6576517B1Jun 10, 2003

Method for obtaining a multi-level ROM in an EEPROM process flow

ST MICROELECTRONICS SRL8 citations73
US6521957B2Feb 18, 2003

Method for forming a multilevel ROM memory in a dual gate CMOS process, and corresponding ROM memory cell

ST MICROELECTRONICS SRL10 citations73
US6479347B1Nov 12, 2002

Simplified DSCP process for manufacturing FLOTOX EEPROM non-autoaligned semiconductor memory cells

ST MICROELECTRONICS SRL12 citations73
US6420769B2Jul 16, 2002

Method for manufacturing electronic devices having HV transistors and LV transistors with salicided junctions

ST MICROELECTRONICS SRL13 citations73
US6380034B1Apr 30, 2002

Process for manufacturing memory cells with dimensional control of the floating gate regions

ST MICROELECTRONICS SRL8 citations73
US6274411B1Aug 14, 2001

Method for manufacturing electronic devices, comprising non-salicided non-volatile memory cells, non-salicided HV transistors, and LV transistors with salicided junctions with few masks

ST MICROELECTRONICS SRL14 citations73
US6194270B1Feb 27, 2001

Process for the manufacturing of an electrically programmable non-volatile memory device

ST MICROELECTRONICS SRL12 citations73
US6414349B1Jul 2, 2002

High efficiency memory device

ST MICROELECTRONICS SRL2 citations62
US6396101B2May 28, 2002

Method for manufacturing electronic devices comprising non-volatile memory cells and LV transistors with salicided junctions

ST MICROELECTRONICS SRL2 citations62
US6340828B1Jan 22, 2002

Process for manufacturing nonvolatile memory cells with dimensional control of the floating gate regions

ST MICROELECTRONICS SRL2 citations62
US6329254B1Dec 11, 2001

Memory cell of the EEPROM type having its threshold adjusted by implantation, and fabrication method

ST MICROELECTRONICS SRL6 citations62
US6307229B2Oct 23, 2001

Nonvolatile semiconductor memory device structure with superimposed bit lines and short-circuit metal strips

ST MICROELECTRONICS SRL4 citations62
US6300181B1Oct 9, 2001

Process for manufacturing an electronic device including MOS transistors with salicided junctions and non-salicided resistors

ST MICROELECTRONICS SRL5 citations62
US6284607B1Sep 4, 2001

Method of making high-voltage HV transistors with drain extension in a CMOS process of the dual gate type with silicide

ST MICROELECTRONICS SRL3 citations62
US6177313B1Jan 23, 2001

Method for forming a muti-level ROM memory in a dual gate CMOS process, and corresponding ROM memory cell

ST MICROELECTRONICS SRL4 citations62
US6548354B2Apr 15, 2003

Process for producing a semiconductor memory device comprising mass-storage memory cells and shielded memory cells for storing reserved information

ST MICROELECTRONICS SRL1 citations51
US6437395B2Aug 20, 2002

Process for the manufacturing of an electrically programmable non-volatile memory device

ST MICROELECTRONICS SRL1 citations51
US6444526B1Sep 3, 2002

Simplified process for defining the tunnel area in non-aligned, non-volatile semiconductor memory cells

ST MICROELECTRONICS SRL0 citations41

SGS THOMSON MICROELECTRONICS

10 patents

ST MICROELECTRICS SRL

2 patents