Inventor
DEBENHAM BRETT M
US11 patents
Patents
11 patentsUS5764650AJun 9, 1998
Intelligent binning for electrically repairable semiconductor chips
MICRON TECHNOLOGY INC94 citations97
US6219810B1Apr 17, 2001
Intelligent binning for electrically repairable semiconductor chips
MICRON TECHNOLOGY INC45 citations95
US6138256AOct 24, 2000
Intelligent binning for electrically repairable semiconductor chips
MICRON TECHNOLOGY INC33 citations95
US6321353B2Nov 20, 2001
Intelligent binning for electrically repairable semiconductor chips
MICRON TECHNOLOGY INC18 citations92
US6185705B1Feb 6, 2001
Method and apparatus for checking the resistance of programmable elements
MICRON TECHNOLOGY INC28 citations92
US6587980B2Jul 1, 2003
Intelligent binning for electrically repairable semiconductor chips
MICRON TECHNOLOGY INC12 citations81
US7519882B2Apr 14, 2009
Intelligent binning for electrically repairable semiconductor chips
MICRON TECHNOLOGY INC4 citations73
US6983404B2Jan 3, 2006
Method and apparatus for checking the resistance of programmable elements
MICRON TECHNOLOGY INC7 citations73
US6523144B2Feb 18, 2003
Intelligent binning for electrically repairable semiconductor chips and method
MICRON TECHNOLOGY INC4 citations73
US5982656ANov 9, 1999
Method and apparatus for checking the resistance of programmable elements
MICRON TECHNOLOGY INC10 citations73
US7237158B2Jun 26, 2007
Intelligent binning for electrically repairable semiconductor chips
MICRON TECHNOLOGY INC1 citations62