P

Inventor

IWASE TAIRA

JP23 patents
⚠️ This page may combine multiple inventors who share the name “IWASE TAIRA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOSHIBA KK

22 patents
US5305284AApr 19, 1994

Semiconductor memory device

TOSHIBA KK98 citations96
US6034910AMar 7, 2000

Semiconductor memory device to which serial access is made and a method for accessing the same

TOSHIBA KK27 citations92
US5392233AFeb 21, 1995

Read only memory capable of realizing high-speed read operation

TOSHIBA KK36 citations92
US5208780AMay 4, 1993

Structure of electrically programmable read-only memory cells and redundancy signature therefor

TOSHIBA KK22 citations89
US4970686ANov 13, 1990

Semiconductor memory cells and semiconductor memory device employing the semiconductor memory cells

TOSHIBA KK38 citations89
US5949703ASep 7, 1999

Semiconductor memory device in which data in programmable ROM can be apparently rewritten

TOSHIBA KK13 citations74
US4855248AAug 8, 1989

Method of making a semiconductor ROM device

TOSHIBA KK8 citations74
US4748492AMay 31, 1988

Read only memory

TOSHIBA KK8 citations74
US4649412AMar 10, 1987

Read only semiconductor memory device with polysilicon drain extensions

TOSHIBA KK8 citations74
US7183838B2Feb 27, 2007

Semiconductor device having internal power supply voltage dropping circuit

TOSHIBA KK7 citations73
US5446700AAug 29, 1995

Decoder circuit having CMOS inverter circuits

TOSHIBA KK18 citations73
US5349563ASep 20, 1994

Mask ROM

TOSHIBA KK10 citations73
US5172337ADec 15, 1992

Semiconductor memory device

TOSHIBA KK11 citations72
US5257230AOct 26, 1993

Memory device including redundancy cells with programmable fuel elements and process of manufacturing the same

TOSHIBA KK14 citations70
US4892841AJan 9, 1990

Method of manufacturing a read only semiconductor memory device

TOSHIBA KK2 citations63
US4737835AApr 12, 1988

Read only memory semiconductor device

TOSHIBA KK3 citations63
US6864719B2Mar 8, 2005

Semiconductor device protecting built-in transistor from the voltage applied at test mode

TOSHIBA KK5 citations62
US6697285B2Feb 24, 2004

Semiconductor memory device

TOSHIBA KK3 citations62
US6600685B2Jul 29, 2003

Semiconductor memory device having test mode

TOSHIBA KK2 citations62
US5403765AApr 4, 1995

Method of manufacturing double-layer gate programmable ROM

TOSHIBA KK2 citations62
US6704922B2Mar 9, 2004

Correcting method of mask and mask manufactured by said method

TOSHIBA KK0 citations52
US7145813B2Dec 5, 2006

Semiconductor device with circuit for detecting abnormal waveform of signal and preventing the signal from being transmitted

TOSHIBA KK0 citations41

TAKIZAWA MAKOTO

1 patent