Inventor
SYZDEK RONALD J
US28 patents
⚠️ This page may combine multiple inventors who share the name “SYZDEK RONALD J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FREESCALE SEMICONDUCTOR INC
12 patentsUS7865797B2Jan 4, 2011
Memory device with adjustable read reference based on ECC and method thereof
FREESCALE SEMICONDUCTOR INC26 citations92
US7545679B1Jun 9, 2009
Electrical erasable programmable memory transconductance testing
FREESCALE SEMICONDUCTOR INC9 citations84
US7564716B2Jul 21, 2009
Memory device with retained indicator of read reference level
FREESCALE SEMICONDUCTOR INC10 citations83
US9837161B2Dec 5, 2017
Split-gate memory having sector retirement with reduced current and method therefor
FREESCALE SEMICONDUCTOR INC7 citations81
US7668018B2Feb 23, 2010
Electronic device including a nonvolatile memory array and methods of using the same
FREESCALE SEMICONDUCTOR INC2 citations63
US7649781B2Jan 19, 2010
Bit cell reference device and methods thereof
FREESCALE SEMICONDUCTOR INC5 citations63
US7843730B2Nov 30, 2010
Non-volatile memory with reduced charge fluence
FREESCALE SEMICONDUCTOR INC2 citations62
US7259999B2Aug 21, 2007
Non-volatile memory cell array for improved data retention and method of operating thereof
FREESCALE SEMICONDUCTOR INC4 citations62
US7782664B2Aug 24, 2010
Method for electrically trimming an NVM reference cell
FREESCALE SEMICONDUCTOR INC6 citations61
US7624329B2Nov 24, 2009
Programming a memory device having error correction logic
FREESCALE SEMICONDUCTOR INC5 citations61
US7742340B2Jun 22, 2010
Read reference technique with current degradation protection
FREESCALE SEMICONDUCTOR INC5 citations59
US9536614B2Jan 3, 2017
Common source architecture for split gate memory
FREESCALE SEMICONDUCTOR INC0 citations40
TEXAS INSTRUMENTS INC
6 patentsUS5694073ADec 2, 1997
Temperature and supply-voltage sensing circuit
TEXAS INSTRUMENTS INC12 citations72
US5668769ASep 16, 1997
Memory device performance by delayed power-down
TEXAS INSTRUMENTS INC6 citations72
US6615391B2Sep 2, 2003
Current controlled multi-state parallel test for semiconductor device
TEXAS INSTRUMENTS INC9 citations70
US5646894AJul 8, 1997
Smart boost circuit for low voltage flash EPROM
TEXAS INSTRUMENTS INC5 citations62
US6408411B1Jun 18, 2002
Two pass multi-state parallel test for semiconductor device
TEXAS INSTRUMENTS INC4 citations59
US6381718B1Apr 30, 2002
Current controlled multi-state parallel test for semiconductor device
TEXAS INSTRUMENTS INC4 citations59
CUNNINGHAM JEFFREY C
3 patentsUS9013927B1Apr 21, 2015
Sector-based regulation of program voltages for non-volatile memory (NVM) systems
CUNNINGHAM JEFFREY C2 citations61
US8310877B2Nov 13, 2012
Read conditions for a non-volatile memory (NVM)
CUNNINGHAM JEFFREY C2 citations60
US9111629B2Aug 18, 2015
Smart charge pump configuration for non-volatile memories
CUNNINGHAM JEFFREY C1 citations51