Inventor

NAGAO MASAHIKO

JP7 patents

⚠️ This page may combine multiple inventors who share the name “NAGAO MASAHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NEC ELECTRONICS CORP

5 patents

US6987894B2Jan 17, 2006

Appearance inspection apparatus and method in which plural threads are processed in parallel

NEC ELECTRONICS CORP22 citations91

US6954274B2Oct 11, 2005

Method of inspecting semiconductor integrated circuit which can quickly measure a cubic body

NEC ELECTRONICS CORP15 citations83

US7664306B2Feb 16, 2010

Visual inspection method and visual inspection apparatus

NEC ELECTRONICS CORP1 citations61

US6950549B2Sep 27, 2005

Visual inspection method and visual inspection apparatus

NEC ELECTRONICS CORP4 citations61

US7545970B2Jun 9, 2009

Visual inspection method and visual inspection apparatus

NEC ELECTRONICS CORP0 citations51

NEC CORP

2 patents

US6597805B1Jul 22, 2003

Visual inspection method for electronic device, visual inspecting apparatus for electronic device, and record medium for recording program which causes computer to perform visual inspecting method for electronic device

NEC CORP12 citations71

US6741734B2May 25, 2004

Appearance inspection method and appearance inspection apparatus having high inspection processing speed

NEC CORP3 citations61