Inventor

YAO PO-SHI

TW3 patents

⚠️ This page may combine multiple inventors who share the name “YAO PO-SHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KUO YUNG-HSIN

1 patent

US8832933B2Sep 16, 2014

Method of fabricating a semiconductor test probe head

KUO YUNG-HSIN10 citations81

TAIWAN SEMICONDUCTOR MFG CO LTD

1 patent

US9417263B2Aug 16, 2016

Testing probe head for wafer level testing, and test probe card

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations70

KUO YUNG HSIN

1 patent

US9891273B2Feb 13, 2018

Test structures and testing methods for semiconductor devices

KUO YUNG HSIN0 citations38